JEDEC JESD91B

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The method described in this document applies to all reliability mechanisms associated with electronic devices.

The purpose of this standard is to provide a reference for developing acceleration models for defect-related and wear-out mechanisms in electronic devices.

Product Details

Published:
03/01/2022
Number of Pages:
20
File Size:
1 file , 370 KB
Note:
This product is unavailable in Belarus, Russia, Ukraine

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