JEDEC JESD51-4A

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The purpose of this document is to provide a design guideline for thermal test chips used for integrated circuit (IC) and transistor package thermal characterization and investigations. The intent of this guideline is to minimize the differences in data gathered due to nonstandard test chips and to provide a well-defined reference for thermal investigations.

Product Details

Published:
06/01/2019
Number of Pages:
26
File Size:
1 file , 1.2 MB
Redline File Size:
2 files , 5.8 MB

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