JEDEC JESD 353 (R2009)

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This noise measurement method applies to transistors whose noise has a Gaussian power distribution, to transistors whose noise has a flat (white) power distribution, and to transistors whose noise has a l/f (power inversely proportional to frequency) power distribution. Formerly known as RS-353 and/or EIA-353.

Product Details

Published:
04/01/1968
Number of Pages:
9
File Size:
1 file , 240 KB

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