JEDEC JEP178
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This document is intended to guide device manufacturers in developing datasheets and to device customers in understanding datasheet entries. Standardized ESD stress test methods have been developed to evaluate the relative sensitivity of devices. Although these methods are available, the results of the testing are not always provided by the suppliers, especially charged device model (CDM) levels. The document provides a standardized template which includes a minimum information set and gives guidelines for expanded individual pin information when needed. The document should improve the availability and usefulness of reported ESD data.
Product Details
- Published:
- 04/01/2021
- Number of Pages:
- 14
- File Size:
- 1 file , 850 KB
