IEC 63202-1 Ed. 1.0 b:2019
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IEC 63202-1:2019 describes procedures for measuring the light-induced degradation (LID) of crystalline silicon photovoltaic (PV) cells in simulated sunlight. The magnitude of LID in a crystalline silicon PV cell is determined by comparing maximum output power at Standard Test Conditions (STC) before, and after, exposure to simulated sunlight at a specified temperature and irradiance.
Product Details
- Edition:
- 1.0
- Published:
- 06/20/2019
- Number of Pages:
- 17
- File Size:
- 1 file , 1.1 MB
