IEC 62899-402-1 Ed. 1.0 en:2017

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IEC 62899-402-1:2017(E) specifies the measurement methods of the widths of the printed patterns in printed electronics. These printed pattern widths are treated as two-dimensional on a substrate. When the patterns are definitely affected by three-dimensional configurations, these are specified in measurement methods for thickness in printed electronics.

Product Details

Edition:

1.0

Published:

03/03/2017

Number of Pages:

12

File Size:

1 file , 380 KB