IEC 60749-31 Ed. 1.0 b:2002

• by admin
• Comments Off on IEC 60749-31 Ed. 1.0 b:2002
• IEC

Click here to purchase
Applicable to semiconductor devices (discrete devices and integrated circuits), this test determines whether the device ignites due to internal heating caused by excessive overloads.

Product Details

Edition:

1.0

Published:

08/30/2002

Number of Pages:

9

File Size:

1 file , 330 KB