JEDEC JP001A

FOUNDRY PROCESS QUALIFICATION GUIDELINES (Wafer Fabrication Manufacturing Sites)
standard by JEDEC Solid State Technology Association, 02/01/2014

JEDEC JESD 370B (R2003)

DESIGNATION SYSTEM FOR SEMICONDUCTOR DEVICES
standard by JEDEC Solid State Technology Association, 02/01/1982

JEDEC JESD8-30

POD125 – 1.25 V PSEUDO OPEN DRAIN I/O
standard by JEDEC Solid State Technology Association, 09/01/2017

JEDEC JESD51-9

TEST BOARDS FOR AREA ARRAY SURFACE MOUNT PACKAGE THERMAL MEASUREMENTS
standard by JEDEC Solid State Technology Association, 07/01/2000

JEDEC JS-002-2014

ANSI/ESDA/JEDEC Joint Standard for Electrostatic Discharge Sensitivity Testing, Charged Device MOdel (CDM) – Device Level
standard by JEDEC Solid State Technology Association, 04/07/2015

JEDEC JESD211.01

ZENER AND VOLTAGE REGULATOR DIODE RATING VERIFICATION AND CHARACTERIZATION TESTING
standard by JEDEC Solid State Technology Association, 11/01/2012

JEDEC JESD 321-C (R2009)

NUMBERING OF LIKE-NAMED TERMINAL FUNCTIONS IN SEMICONDUCTOR DEVICES AND DESIGNATION OF UNITS IN MULTIPLE-UNIT SEMICONDUCTOR DEVICES
standard by JEDEC Solid State Technology Association, 02/01/1987

JEDEC JEP152

DDR2 DIMM CLOCK SKEW MEASUREMENT PROCEDURE USING A CLOCK REFERENCE BOARD
standard by JEDEC Solid State Technology Association, 05/01/2007

JEDEC JESD22-B111

BOARD LEVEL DROP TEST METHOD OF COMPONENTS FOR HANDHELD ELECTRONIC PRODUCTS
standard by JEDEC Solid State Technology Association, 07/01/2003

JEDEC JESD50B.01

SPECIAL REQUIREMENTS FOR MAVERICK PRODUCT ELIMINATION AND OUTLIER MANAGEMENT
standard by JEDEC Solid State Technology Association, 11/01/2008