FIELD-INDUCED CHARGED-DEVICE MODEL TEST METHOD FOR ELECTROSTATIC DISCHARGE WITHSTAND THRESHOLDS OF MICROELECTRONIC COMPONENTS
standard by JEDEC Solid State Technology Association, 12/01/2009
SEMICONDUCTOR WAFER AND DIE BACKSIDE EXTERNAL VISUAL INSPECTION
standard by JEDEC Solid State Technology Association, 03/01/2011
QUALITY SYSTEM ASSESSMENT
standard by JEDEC Solid State Technology Association, 10/01/2013
Universal Flash Storage (UFS)
standard by JEDEC Solid State Technology Association, 01/01/2018
300 mV INTERFACE
standard by JEDEC Solid State Technology Association, 06/01/2015
JOINT JEDEC/ECA STANDARD, DEFINING "LOW-HALOGEN" PASSIVES AND SOLID STATE DEVICES (Removal of BFR/CFR/PVC)
standard by JEDEC Solid State Technology Association, 08/01/2011
Graphics Double Data Rate (GDDR6) SGRAM Standard
standard by JEDEC Solid State Technology Association, 11/01/2018
MULTIMEDIACARD (MMC) ELECTRICAL STANDARD, HIGH CAPACITY (MMCA, 4.2)
standard by JEDEC Solid State Technology Association, 07/01/2007
CURRENT TIN WHISKERS THEORY AND MITIGATION PRACTICES GUIDELINE
standard by JEDEC Solid State Technology Association, 03/01/2006
GENERAL REQUIREMENTS FOR DISTRIBUTORS OF COMMERCIAL AND MILITARY SEMICONDUCTOR DEVICES
standard by JEDEC Solid State Technology Association, 11/01/2016
