JEDEC JESD22-A117D
ELECTRICALLY ERASABLE PROGRAMMABLE ROM (EEPROM) PROGRAM/ERASE ENDURANCE AND DATA RETENTION TEST
standard by JEDEC Solid State Technology Association, 08/01/2018
- Comments Off on JEDEC JESD22-A117D
- JEDEC
ELECTRICALLY ERASABLE PROGRAMMABLE ROM (EEPROM) PROGRAM/ERASE ENDURANCE AND DATA RETENTION TEST
standard by JEDEC Solid State Technology Association, 08/01/2018
PRECONDITIONING OF PLASTIC SURFACE MOUNT DEVICES PRIOR TO RELIABILITY TESTING
standard by JEDEC Solid State Technology Association, 10/01/2008
BALL GRID ARRAY PINOUTS STANDARDIZED FOR 32-BIT LOGIC FUNCTIONS
standard by JEDEC Solid State Technology Association, 11/01/1999
0.6 V Low Voltage Swing Terminated Logic (LVSTL06)
standard by JEDEC Solid State Technology Association, 12/01/2016
IPC/JEDEC-9703: Mechanical Shock Test Guidelines for Solder Joint Reliability
standard by JEDEC Solid State Technology Association, 03/01/2009
COMMON FLASH INTERFACE (CFI)
standard by JEDEC Solid State Technology Association, 09/01/2003
HERMETICITY
standard by JEDEC Solid State Technology Association, 11/01/2011
QUALITY SYSTEM ASSESSMENT
standard by JEDEC Solid State Technology Association, 10/01/2013
Universal Flash Storage (UFS)
standard by JEDEC Solid State Technology Association, 01/01/2018
MECHANICAL SHOCK
standard by JEDEC Solid State Technology Association, 11/01/2004