JEDEC JESD22-A117D

ELECTRICALLY ERASABLE PROGRAMMABLE ROM (EEPROM) PROGRAM/ERASE ENDURANCE AND DATA RETENTION TEST
standard by JEDEC Solid State Technology Association, 08/01/2018

JEDEC JESD22-A113F

PRECONDITIONING OF PLASTIC SURFACE MOUNT DEVICES PRIOR TO RELIABILITY TESTING
standard by JEDEC Solid State Technology Association, 10/01/2008

JEDEC JESD75

BALL GRID ARRAY PINOUTS STANDARDIZED FOR 32-BIT LOGIC FUNCTIONS
standard by JEDEC Solid State Technology Association, 11/01/1999

JEDEC JESD8-29

0.6 V Low Voltage Swing Terminated Logic (LVSTL06)
standard by JEDEC Solid State Technology Association, 12/01/2016

JEDEC JS 9703

IPC/JEDEC-9703: Mechanical Shock Test Guidelines for Solder Joint Reliability
standard by JEDEC Solid State Technology Association, 03/01/2009

JEDEC JESD68.01

COMMON FLASH INTERFACE (CFI)
standard by JEDEC Solid State Technology Association, 09/01/2003

JEDEC JESD22-A109B

HERMETICITY
standard by JEDEC Solid State Technology Association, 11/01/2011

JEDEC JESD670A

QUALITY SYSTEM ASSESSMENT
standard by JEDEC Solid State Technology Association, 10/01/2013

JEDEC JESD220D

Universal Flash Storage (UFS)
standard by JEDEC Solid State Technology Association, 01/01/2018