JEDEC JP001.01

FOUNDRY PROCESS QUALIFICATION GUIDELINES (Wafer Fabrication Manufacturing Sites)
standard by JEDEC Solid State Technology Association, 05/01/2004

JEDEC JESD216B

SERIAL FLASH DISCOVERABLE PARAMETERS (SFDP)
standard by JEDEC Solid State Technology Association, 05/01/2014

JEDEC JESD234

Test Standard for the Measurement of Proton Radiation Single Event Effects in Electronic Devices
standard by JEDEC Solid State Technology Association, 10/01/2013

JEDEC JESD210

AVALANCHE BREAKDOWN DIODE (ABD) TRANSIENT VOLTAGE SUPPRESSORS
standard by JEDEC Solid State Technology Association, 12/01/2007

JEDEC JESD75-3

BALL GRID ARRAY PINOUTS STANDARDIZED FOR 8-BIT LOGIC FUNCTIONS
standard by JEDEC Solid State Technology Association, 07/01/2001

JEDEC JESD22-A103C

HIGH TEMPERATURE STORAGE LIFE
standard by JEDEC Solid State Technology Association, 11/01/2004

JEDEC JESD230B

NAND Flash Interface Interoperability
standard by JEDEC Solid State Technology Association, 07/01/2014

JEDEC JESD 78B

IC LATCH-UP TEST
standard by JEDEC Solid State Technology Association, 12/01/2008

JEDEC JESD22-A107C

Salt Atmosphere
standard by JEDEC Solid State Technology Association, 04/01/2013

JEDEC JESD47I

STRESS-TEST-DRIVEN QUALIFICATION OF INTEGRATED CIRCUITS
standard by JEDEC Solid State Technology Association, 04/01/2011