JEDEC JESD78E
IC LATCH-UP TEST
standard by JEDEC Solid State Technology Association, 04/01/2016
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- JEDEC
IC LATCH-UP TEST
standard by JEDEC Solid State Technology Association, 04/01/2016
STRESS-TEST-DRIVEN QUALIFICATION OF INTEGRATED CIRCUITS
standard by JEDEC Solid State Technology Association, 09/01/2017
SERIAL FLASH RESET SIGNALING PROTOCOL
standard by JEDEC Solid State Technology Association, 10/01/2018
Wide I/O Single Data Rate (Wide I/O SDR)
standard by JEDEC Solid State Technology Association, 12/01/2011
Guidelines for Visual Inspection and Control of Flip Chip Type Components (FCxGA)
standard by JEDEC Solid State Technology Association, 01/01/2013
STANDARD FOR DEFINITION OF THE SSTV16859 2.5 V, 13-BIT TO 26-BIT SSTL_2 REGISTERED BUFFER FOR STACKED DDR DIMM APPLICATIONS
standard by JEDEC Solid State Technology Association, 05/01/2003
HSUL_12 LPDDR2 and LPDDR3 I/O with Optional ODT
standard by JEDEC Solid State Technology Association, 04/01/2014
MEASUREMENT OF SMALL VALUES OF TRANSISTOR CAPACITANCE
standard by JEDEC Solid State Technology Association, 07/01/1972
DIGITAL BIPOLAR LOGIC PINOUTS FOR CHIP CARRIERS
standard by JEDEC Solid State Technology Association, 12/01/1982
Low Power Double Data Rate 3 SDRAM (LPDDR3)
standard by JEDEC Solid State Technology Association, 08/01/2013