JEDEC JESD 23
TEST METHODS AND CHARACTER DESIGNATION FOR LIQUID CRYSTAL DEVICES: Â
standard by JEDEC Solid State Technology Association, 05/01/1982
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TEST METHODS AND CHARACTER DESIGNATION FOR LIQUID CRYSTAL DEVICES: Â
standard by JEDEC Solid State Technology Association, 05/01/1982
Low Power Double Data Rate 5 (LPDDR5)
standard by JEDEC Solid State Technology Association, 02/01/2019
ADDENDUM No. 9B to JESD8 – STUB SERIES TERMINATED LOGIC FOR 2.5 VOLTS (SSTL_2): Includes Errata and Corrected Page 7 as of October 18, 2002
standard by JEDEC Solid State Technology Association, 05/01/2002
BOND WIRE MODELING STANDARD
standard by JEDEC Solid State Technology Association, 06/01/1997
STANDARD FOR CHAIN DESCRIPTION FILE
standard by JEDEC Solid State Technology Association, 06/01/1996
THE MEASUREMENT OF TRANSISTOR EQUIVALENT NOISE VOLTAGE AND EQUIVALENT NOISE CURRENT AT FREQUENCIES OF UP TO 20 kHz
standard by JEDEC Solid State Technology Association, 04/01/1968
AND LABELING OF COMPONENTS, PCBs AND PCBAs TO IDENTIFY LEAD (Pb), Pb-FREE AND OTHER ATTRIBUTES
standard by JEDEC Solid State Technology Association, 02/01/2011
DEFINITION OF SKEW SPECIFICATIONS FOR STANDARD LOGIC DEVICES
standard by JEDEC Solid State Technology Association, 09/01/2003
STRESS-TEST-DRIVEN QUALIFICATION OF INTEGRATED CIRCUITS
standard by JEDEC Solid State Technology Association, 10/01/2016
POWER MOSFETS
standard by JEDEC Solid State Technology Association, 07/01/1985