JEDEC JESD71
STANDARD TEST AND PROGRAMMING LANGUAGE (STAPL)
standard by JEDEC Solid State Technology Association, 08/01/1999
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STANDARD TEST AND PROGRAMMING LANGUAGE (STAPL)
standard by JEDEC Solid State Technology Association, 08/01/1999
INTEGRATED CIRCUIT THERMAL MEASUREMENT METHOD – ELECTRICAL TEST METHOD (SINGLE SEMICONDUCTOR DEVICE)
standard by JEDEC Solid State Technology Association, 12/01/1995
Low Power Double Data Rate 5 (LPDDR5)
standard by JEDEC Solid State Technology Association, 02/01/2019
ADDENDUM No. 9B to JESD8 – STUB SERIES TERMINATED LOGIC FOR 2.5 VOLTS (SSTL_2): Includes Errata and Corrected Page 7 as of October 18, 2002
standard by JEDEC Solid State Technology Association, 05/01/2002
BOND WIRE MODELING STANDARD
standard by JEDEC Solid State Technology Association, 06/01/1997
SERIAL FLASH DISCOVERABLE PARAMETERS (SFDP)
standard by JEDEC Solid State Technology Association, 07/01/2013
Addendum No. 1 to JESD251, Optional x4 Quad I/O With Data Strobe
Amendment by JEDEC Solid State Technology Association, 10/01/2018
FAILURE-MECHANISM-DRIVEN RELIABILITY MONITORING
standard by JEDEC Solid State Technology Association, 04/01/2017
GUIDELINE FOR MEASUREMENT OF ELECTRONIC PACKAGE INDUCTANCE AND CAPACITANCE MODEL PARAMETERS
standard by JEDEC Solid State Technology Association, 10/01/1995
UNIVERSAL FLASH STORAGE (UFS) SECURITY EXTENSION
standard by JEDEC Solid State Technology Association, 11/01/2016