JEDEC JESD 35-A
PROCEDURE FOR WAFER-LEVEL-TESTING OF THIN DIELECTRICS
standard by JEDEC Solid State Technology Association, 03/01/2010
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PROCEDURE FOR WAFER-LEVEL-TESTING OF THIN DIELECTRICS
standard by JEDEC Solid State Technology Association, 03/01/2010
FOUNDRY PROCESS QUALIFICATION GUIDELINES – BACKEND OF LINE (Wafer Fabrication Manufacturing Sites)
standard by JEDEC Solid State Technology Association, 09/01/2018
HIgh Bandwidth Memory DRAM (HBM1, HBM2)
standard by JEDEC Solid State Technology Association, 11/01/2018
QUALITY AND RELIABILITY STANDARDS AND PUBLICATIONS
standard by JEDEC Solid State Technology Association, 10/01/1999
LRDIMM DDR3 MEMORY BUFFER (MB)
standard by JEDEC Solid State Technology Association, 10/01/2014
ADDENDUM No. 7 to JESD8 – 1.8 V + -0.15 V (NORMAL RANGE), AND 1.2 V – 1.95 V (WIDE RANGE) POWER SUPPLY VOLTAGE AND INTERFACE STANDARD FOR NONTERMINATED DIGITAL INTEGRATED CIRCUIT
standard by JEDEC Solid State Technology Association, 06/01/2006
STANDARD FOR FAILURE ANALYSIS REPORT FORMAT
standard by JEDEC Solid State Technology Association, 12/01/1995
MARKING PERMANENCY
standard by JEDEC Solid State Technology Association, 09/01/2004
THE MEASUREMENT OF SMALL-SIGNAL VHF-UHF TRANSISTOR SHORT-CIRCUIT FORWARD CURRENT TRANSFER RATIO
standard by JEDEC Solid State Technology Association, 02/01/1970
ACCELERATED MOISTURE RESISTANCE – UNBIASED AUTOCLAVE
standard by JEDEC Solid State Technology Association, 11/01/2010