JEDEC JESD22-B116B
WIRE BOND SHEAR TEST
standard by JEDEC Solid State Technology Association, 04/01/2017
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WIRE BOND SHEAR TEST
standard by JEDEC Solid State Technology Association, 04/01/2017
TRANSIENT VOLTAGE SUPPRESSOR STANDARD FOR THYRISTOR SURGE PROTECTIVE DEVICE
standard by JEDEC Solid State Technology Association, 11/01/1999
LOW POWER DOUBLE DATA RATE 2 (LPDDR2)
standard by JEDEC Solid State Technology Association, 02/01/2010
STANDARD FOR MEASURING FORWARD SWITCHING CHARACTERISTICS OF SEMICONDUCTOR DIODES
standard by JEDEC Solid State Technology Association, 02/01/2000
METHODS OF MEASUREMENT FOR SEMICONDUCTOR LOGIC GATING MICROCIRCUITS
standard by JEDEC Solid State Technology Association, 01/01/1970
DEFINITION OF CVF857 PLL CLOCK DRIVER FOR REGISTERED PC1600, PC2100, PC2700, AND PC3200 DIMM APPLICATIONS
standard by JEDEC Solid State Technology Association, 05/01/2004
Addendum No. 1 to JESD79-3 – 1.35 V DDR3L-800, DDR3L-1066, DDR3L-1333, and DDR3L-1600
Amendment by JEDEC Solid State Technology Association, 07/01/2010
JEDEC Dictionary of Terms for Solid-State Technology, Sixth Edition
standard by JEDEC Solid State Technology Association, 06/01/2013
IC LATCH-UP TEST
standard by JEDEC Solid State Technology Association, 09/01/2010
PROCEDURE FOR WAFER-LEVEL-TESTING OF THIN DIELECTRICS
standard by JEDEC Solid State Technology Association, 03/01/2010