JEDEC JEB 5-A (R1984)
METHODS OF MEASUREMENT FOR SEMICONDUCTOR LOGIC GATING MICROCIRCUITS
standard by JEDEC Solid State Technology Association, 01/01/1970
- Comments Off on JEDEC JEB 5-A (R1984)
- JEDEC
METHODS OF MEASUREMENT FOR SEMICONDUCTOR LOGIC GATING MICROCIRCUITS
standard by JEDEC Solid State Technology Association, 01/01/1970
STANDARD FOR MEASURING FORWARD SWITCHING CHARACTERISTICS OF SEMICONDUCTOR DIODES
standard by JEDEC Solid State Technology Association, 02/01/2000
ADDENDUM No. 3A to JESD8 – GUNNING TRANSCEIVER LOGIC (GTL) LOW-LEVEL, HIGH-SPEED INTERFACE STANDARD FOR DIGITAL INTEGRATED CIRCUITS
standard by JEDEC Solid State Technology Association, 05/01/2007
WIRE BOND SHEAR TEST
standard by JEDEC Solid State Technology Association, 04/01/2017
TRANSIENT VOLTAGE SUPPRESSOR STANDARD FOR THYRISTOR SURGE PROTECTIVE DEVICE
standard by JEDEC Solid State Technology Association, 11/01/1999
LRDIMM DDR3 MEMORY BUFFER (MB)
standard by JEDEC Solid State Technology Association, 10/01/2014
ADDENDUM No. 7 to JESD8 – 1.8 V + -0.15 V (NORMAL RANGE), AND 1.2 V – 1.95 V (WIDE RANGE) POWER SUPPLY VOLTAGE AND INTERFACE STANDARD FOR NONTERMINATED DIGITAL INTEGRATED CIRCUIT
standard by JEDEC Solid State Technology Association, 06/01/2006
STANDARD FOR FAILURE ANALYSIS REPORT FORMAT
standard by JEDEC Solid State Technology Association, 12/01/1995
MARKING PERMANENCY
standard by JEDEC Solid State Technology Association, 09/01/2004
EMBEDDED MULTIMEDIACARD(e*MMC) e*MMC/CARD PRODUCT STANDARD, HIGH CAPACITY, including Reliable Write, Boot, Sleep Modes, Dual Data Rate, Multiple Partitions Supports, Security Enhancement, Background Operation and High Priority Interrupt (MMCA, 4.41)
standard by JEDEC Solid State Technology Association, 03/01/2010