JEDEC JESD12
SEMICUSTOM INTEGRATED CIRCUITS (FORMERLY PUBLISHED AS STANDARD FOR GATE ARRAY BENCHMARK SET)
standard by JEDEC Solid State Technology Association, 06/01/1985
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- JEDEC
SEMICUSTOM INTEGRATED CIRCUITS (FORMERLY PUBLISHED AS STANDARD FOR GATE ARRAY BENCHMARK SET)
standard by JEDEC Solid State Technology Association, 06/01/1985
CUSTOMER NOTIFICATION OF PRODUCT/PROCESS CHANGES BY SEMICONDUCTOR SUPPLIERS
standard by JEDEC Solid State Technology Association, 10/01/2006
A PROCEDURE FOR MEASURING P-CHANNEL MOSFET NEGATIVE BIAS TEMPERATURE INSTABILITIES
standard by JEDEC Solid State Technology Association, 11/01/2004
FULLY BUFFERED DIMM DESIGN FOR TEST, DESIGN FOR VALIDATION (DFx)
standard by JEDEC Solid State Technology Association, 07/01/2008
DEFINITION OF THE SSTUB32869 REGISTERED BUFFER WITH PARITY FOR DDR2 RDIMM APPLICATIONS
standard by JEDEC Solid State Technology Association, 05/01/2007
VIBRATION, VARIABLE FREQUENCY
standard by JEDEC Solid State Technology Association, 06/01/2002
JC-42.6 MANUFACTURER IDENTIFICATION (ID) CODE FOR LOW POWER MEMORIES
standard by JEDEC Solid State Technology Association, 12/01/2014
TEST BOARDS FOR THROUGH-HOLE AREA ARRAY LEADED PACKAGE THERMAL MEASUREMENT
standard by JEDEC Solid State Technology Association, 06/01/2001
CUSTOMER NOTIFICATION OF PRODUCT/PROCESS CHANGES BY ELECTRONIC PRODUCT SUPPLIERS
standard by JEDEC Solid State Technology Association,
LOW POWER DOUBLE DATA RATE 2 (LPDDR2)
standard by JEDEC Solid State Technology Association, 02/01/2010