JEDEC JEP148B

RELIABILITY QUALIFICATION OF SEMICONDUCTOR DEVICES BASED ON PHYSICS OF FAILURE RISK AND OPPORTUNITY ASSESSMENT
standard by JEDEC Solid State Technology Association, 01/01/2014

JEDEC JESD75-1

BALL GRID ARRAY PINOUTS STANDARDIZED FOR 16, 18, AND 20-BIT LOGIC FUNCTIONS USING A 54 BALL PACKAGE
standard by JEDEC Solid State Technology Association, 10/01/2001

JEDEC JESD 24-11 (R2002)

ADDENDUM No. 11 to JESD24 – POWER MOSFET EQUIVALENT SERIES GATE RESISTANCE TEST METHOD
Amendment by JEDEC Solid State Technology Association, 08/01/1996

JEDEC JESD99B

TERMS, DEFINITIONS, AND LETTER SYMBOLS FOR MICROELECTRONIC DEVICES
standard by JEDEC Solid State Technology Association, 05/01/2007

JEDEC JESD72 (R2007)

TEST METHODS AND ACCEPTANCE PROCEDURES FOR THE EVALUATION OF POLYMERIC MATERIALS
standard by JEDEC Solid State Technology Association, 06/01/2001

JEDEC JESD22-B101C

EXTERNAL VISUAL
standard by JEDEC Solid State Technology Association, 10/01/2015

JEDEC JEP150

STRESS-TEST-DRIVEN QUALIFICATION OF AND FAILURE MECHANISMS ASSOCIATED WITH ASSEMBLED SOLID STATE SURFACE-MOUNT COMPONENTS
standard by JEDEC Solid State Technology Association, 05/01/2005

JEDEC JESD8-21A

POD135 – 1.35 V PSEUDO OPEN DRAIN I/O
standard by JEDEC Solid State Technology Association, 09/01/2013

JEDEC JESD49A.01

PROCUREMENT STANDARD FOR KNOWN GOOD DIE (KGD)
standard by JEDEC Solid State Technology Association, 10/01/2013