JEDEC JESD82-17

DEFINITION OF THE SSTUA32S868 AND SSTUA32D868 REGISTERED BUFFER WITH PARITY FOR 2R X 4 DDR2 RDIMM APPLICATIONS
standard by JEDEC Solid State Technology Association, 11/01/2005

JEDEC JESD209-2E

Low Power Double Data Rate 2 (LPDDR2)
standard by JEDEC Solid State Technology Association, 04/01/2011

JEDEC JS709A

JOINT JEDEC/ECA STANDARD, DEFINING "LOW-HALOGEN" PASSIVES AND SOLID STATE DEVICES (Removal of BFR/CFR/PVC)
standard by JEDEC Solid State Technology Association, 05/01/2012

JEDEC JESD226

RF Biased Life (RFBL) Test Method
standard by JEDEC Solid State Technology Association, 01/01/2013

JEDEC JESD51-8

INTEGRATED CIRCUIT THERMAL TEST METHOD ENVIRONMENTAL CONDITIONS – JUNCTION-TO-BOARD
standard by JEDEC Solid State Technology Association, 10/01/1999

JEDEC JESD63

STANDARD METHOD FOR CALCULATING THE ELECTROMIGRATION MODEL PARAMETERS FOR CURRENT DENSITY AND TEMPERATURE
standard by JEDEC Solid State Technology Association, 02/01/1998

JEDEC JEP134

GUIDELINES FOR PREPARING CUSTOMER-SUPPLIED BACKGROUND INFORMATION RELATING TO A SEMICONDUCTOR-DEVICE FAILURE ANALYSIS
standard by JEDEC Solid State Technology Association, 09/01/1998

JEDEC JESD84-B45

Embedded Multi-media card (e*MMC), Electrical Standard (4.5 Device)
standard by JEDEC Solid State Technology Association, 06/01/2011

JEDEC JEP118

GUIDELINES FOR GaAs MMIC AND FET LIFE TESTING
standard by JEDEC Solid State Technology Association, 12/01/2018

JEDEC JEP148B

RELIABILITY QUALIFICATION OF SEMICONDUCTOR DEVICES BASED ON PHYSICS OF FAILURE RISK AND OPPORTUNITY ASSESSMENT
standard by JEDEC Solid State Technology Association, 01/01/2014