JEDEC JESD226

RF Biased Life (RFBL) Test Method
standard by JEDEC Solid State Technology Association, 01/01/2013

JEDEC JESD51-8

INTEGRATED CIRCUIT THERMAL TEST METHOD ENVIRONMENTAL CONDITIONS – JUNCTION-TO-BOARD
standard by JEDEC Solid State Technology Association, 10/01/1999

JEDEC JESD63

STANDARD METHOD FOR CALCULATING THE ELECTROMIGRATION MODEL PARAMETERS FOR CURRENT DENSITY AND TEMPERATURE
standard by JEDEC Solid State Technology Association, 02/01/1998

JEDEC JEP134

GUIDELINES FOR PREPARING CUSTOMER-SUPPLIED BACKGROUND INFORMATION RELATING TO A SEMICONDUCTOR-DEVICE FAILURE ANALYSIS
standard by JEDEC Solid State Technology Association, 09/01/1998

JEDEC JESD91-A (R2011)

METHOD FOR DEVELOPING ACCELERATION MODELS FOR ELECTRONIC COMPONENT FAILURE MECHANISMS
standard by JEDEC Solid State Technology Association, 08/01/2003

JEDEC JESD60A

A PROCEDURE FOR MEASURING P-CHANNEL MOSFET HOT-CARRIER-INDUCED DEGRADATION AT MAXIMUM GATE CURRENT UNDER DC STRESS
standard by JEDEC Solid State Technology Association, 09/01/2004

JEDEC JESD22-A111A

EVALUATION PROCEDURE FOR DETERMINING CAPABILITY TO BOTTOM SIDE BOARD ATTACH BY FULL BODY SOLDER IMMERSION OF SMALL SURFACE MOUNT SOLID STATE DEVICES
standard by JEDEC Solid State Technology Association, 11/01/2010

JEDEC JESD 24-11 (R2002)

ADDENDUM No. 11 to JESD24 – POWER MOSFET EQUIVALENT SERIES GATE RESISTANCE TEST METHOD
Amendment by JEDEC Solid State Technology Association, 08/01/1996

JEDEC JESD99B

TERMS, DEFINITIONS, AND LETTER SYMBOLS FOR MICROELECTRONIC DEVICES
standard by JEDEC Solid State Technology Association, 05/01/2007

JEDEC JESD72 (R2007)

TEST METHODS AND ACCEPTANCE PROCEDURES FOR THE EVALUATION OF POLYMERIC MATERIALS
standard by JEDEC Solid State Technology Association, 06/01/2001