JEDEC JESD 24-6 (R2002)
ADDENDUM No. 6 to JESD24 – THERMAL IMPEDANCE MEASUREMENTS FOR INSULATED GATE BIPOLAR TRANSISTORS
Amendment by JEDEC Solid State Technology Association, 10/01/2001
- Comments Off on JEDEC JESD 24-6 (R2002)
- JEDEC
ADDENDUM No. 6 to JESD24 – THERMAL IMPEDANCE MEASUREMENTS FOR INSULATED GATE BIPOLAR TRANSISTORS
Amendment by JEDEC Solid State Technology Association, 10/01/2001
STANDARD FOR DEFINITION OF THE CUA877 AND CU2A877 PLL CLOCK DRIVERSFOR REGISTERED DDR2 DIMM APPLICATIONS
standard by JEDEC Solid State Technology Association, 01/01/2007
GUIDELINE FOR RESIDUAL GAS ANALYSIS (RGA) FOR MICROELECTRONIC PACKAGES
standard by JEDEC Solid State Technology Association, 11/01/2011
POD125 – 1.25 V Pseudo Open Drain I/O
standard by JEDEC Solid State Technology Association, 06/01/2019
THERMAL RESISTANCE TEST METHOD FOR SIGNAL AND REGULATOR DIODES (FORWARD VOLTAGE, SWITCHING METHOD)
standard by JEDEC Solid State Technology Association, 07/01/1986
Low Power Double Data Rate 2 (LPDDR2)
standard by JEDEC Solid State Technology Association, 04/01/2011
JOINT JEDEC/ECA STANDARD, DEFINING "LOW-HALOGEN" PASSIVES AND SOLID STATE DEVICES (Removal of BFR/CFR/PVC)
standard by JEDEC Solid State Technology Association, 05/01/2012
RF Biased Life (RFBL) Test Method
standard by JEDEC Solid State Technology Association, 01/01/2013
INTEGRATED CIRCUIT THERMAL TEST METHOD ENVIRONMENTAL CONDITIONS – JUNCTION-TO-BOARD
standard by JEDEC Solid State Technology Association, 10/01/1999
STANDARD METHOD FOR CALCULATING THE ELECTROMIGRATION MODEL PARAMETERS FOR CURRENT DENSITY AND TEMPERATURE
standard by JEDEC Solid State Technology Association, 02/01/1998