JEDEC JESD82-18A
STANDARD FOR DEFINITION OF THE CUA877 AND CU2A877 PLL CLOCK DRIVERSFOR REGISTERED DDR2 DIMM APPLICATIONS
standard by JEDEC Solid State Technology Association, 01/01/2007
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STANDARD FOR DEFINITION OF THE CUA877 AND CU2A877 PLL CLOCK DRIVERSFOR REGISTERED DDR2 DIMM APPLICATIONS
standard by JEDEC Solid State Technology Association, 01/01/2007
GUIDELINE FOR RESIDUAL GAS ANALYSIS (RGA) FOR MICROELECTRONIC PACKAGES
standard by JEDEC Solid State Technology Association, 11/01/2011
POD125 – 1.25 V Pseudo Open Drain I/O
standard by JEDEC Solid State Technology Association, 06/01/2019
THERMAL RESISTANCE TEST METHOD FOR SIGNAL AND REGULATOR DIODES (FORWARD VOLTAGE, SWITCHING METHOD)
standard by JEDEC Solid State Technology Association, 07/01/1986
GUIDELINE FOR DEVELOPING AND DOCUMENTING PACKAGE ELECTRICAL MODELS DERIVED FROM COMPUTATIONAL ANALYSIS
standard by JEDEC Solid State Technology Association, 05/01/1996
INTEGRATED CIRCUIT THERMAL TEST METHOD ENVIRONMENTAL CONDITIONS – JUNCTION-TO-BOARD
standard by JEDEC Solid State Technology Association, 10/01/1999
STANDARD METHOD FOR CALCULATING THE ELECTROMIGRATION MODEL PARAMETERS FOR CURRENT DENSITY AND TEMPERATURE
standard by JEDEC Solid State Technology Association, 02/01/1998
GUIDELINES FOR PREPARING CUSTOMER-SUPPLIED BACKGROUND INFORMATION RELATING TO A SEMICONDUCTOR-DEVICE FAILURE ANALYSIS
standard by JEDEC Solid State Technology Association, 09/01/1998
METHOD FOR DEVELOPING ACCELERATION MODELS FOR ELECTRONIC COMPONENT FAILURE MECHANISMS
standard by JEDEC Solid State Technology Association, 08/01/2003
A PROCEDURE FOR MEASURING P-CHANNEL MOSFET HOT-CARRIER-INDUCED DEGRADATION AT MAXIMUM GATE CURRENT UNDER DC STRESS
standard by JEDEC Solid State Technology Association, 09/01/2004