JEDEC JEP128
GUIDE FOR STANDARD PROBE PAD SIZES AND LAYOUTS FOR WAFER LEVEL ELECTRICAL TESTING
standard by JEDEC Solid State Technology Association, 11/01/1996
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GUIDE FOR STANDARD PROBE PAD SIZES AND LAYOUTS FOR WAFER LEVEL ELECTRICAL TESTING
standard by JEDEC Solid State Technology Association, 11/01/1996
Notification Standard for Product Discontinuance
standard by JEDEC Solid State Technology Association, 11/01/2014
DEFINITION OF the SSTUB32865 28-bit 1:2 REGISTERED BUFFER WITH PARITY FOR DDR2 RDIMM APPLICATIONS
standard by JEDEC Solid State Technology Association, 05/01/2007
MARK LEGIBILITY
standard by JEDEC Solid State Technology Association, 03/01/2008
GUIDE FOR THE PRODUCTION AND ACQUISITION OF RADIATION-HARDNESS ASSURED MULTICHIP MODULES AND HYBRID MICROCIRCUITS
standard by JEDEC Solid State Technology Association, 01/01/2010
Graphics Double Data Rate (GDDR5X) SGRAM Standard
standard by JEDEC Solid State Technology Association, 11/01/2015
METHOD OF DIODE Q MEASUREMENT
standard by JEDEC Solid State Technology Association, 11/01/1981
DICTIONARY OF TERMS FOR SOLID STATE TECHNOLOGY, FOURTH EDITION
standard by JEDEC Solid State Technology Association, 07/01/2007
STEADY-STATE TEMPERATURE HUMIDITY BIAS LIFE TEST
standard by JEDEC Solid State Technology Association, 03/01/2009
Characterization of Interfacial Adhesion in Semiconductor Packages
standard by JEDEC Solid State Technology Association, 04/01/2013