JEDEC JESD241

Procedure for Wafer-Level DC Characterization of Bias Temperature Instabilities
standard by JEDEC Solid State Technology Association, 12/01/2015

JEDEC JESD 35-1

ADDENDUM No. 1 to JESD35 – GENERAL GUIDELINES FOR DESIGNING TEST STRUCTURES FOR THE WAFER-LEVEL TESTING OF THIN DIELECTRICS
standard by JEDEC Solid State Technology Association, 09/01/1995

JEDEC JESD76-1

STANDARD DESCRIPTION OF 1.2 V CMOS LOGIC DEVICES (WIDE RANGE OPERATION)
standard by JEDEC Solid State Technology Association, 06/01/2001

JEDEC JESD22-A113H

PRECONDITIONING OF NONHERMETIC SURFACE MOUNT DEVICES PRIOR TO RELIABILITY TESTING
standard by JEDEC Solid State Technology Association, 11/01/2016

JEDEC JESD220

Universal Flash Storage (UFS)
standard by JEDEC Solid State Technology Association, 02/01/2011

JEDEC JEP709

A Guideline for Defining "Low-Halogen" Solid State Devices (Removal of BFR/CFR/PVC)
standard by JEDEC Solid State Technology Association, 11/01/2010

JEDEC JEP69-B (R1999)

PREFERRED LEAD CONFIGURATION FOR FIELD-EFFECT TRANSISTORS
standard by JEDEC Solid State Technology Association, 11/01/1973

JEDEC JESD50C

SPECIAL REQUIREMENTS FOR MAVERICK PRODUCT ELIMINATION AND OUTLIER MANAGEMENT
standard by JEDEC Solid State Technology Association, 01/01/2018

JEDEC JESD247

Multi-wire Multi-level I/O Standard
standard by JEDEC Solid State Technology Association, 06/01/2016

JEDEC JESD223-1

Universal Flash Storage Host Controller Interface (UFSHCI), Unified Memory Extension
standard by JEDEC Solid State Technology Association, 09/01/2013