JEDEC JESD241
Procedure for Wafer-Level DC Characterization of Bias Temperature Instabilities
standard by JEDEC Solid State Technology Association, 12/01/2015
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Procedure for Wafer-Level DC Characterization of Bias Temperature Instabilities
standard by JEDEC Solid State Technology Association, 12/01/2015
ADDENDUM No. 1 to JESD35 – GENERAL GUIDELINES FOR DESIGNING TEST STRUCTURES FOR THE WAFER-LEVEL TESTING OF THIN DIELECTRICS
standard by JEDEC Solid State Technology Association, 09/01/1995
STANDARD DESCRIPTION OF 1.2 V CMOS LOGIC DEVICES (WIDE RANGE OPERATION)
standard by JEDEC Solid State Technology Association, 06/01/2001
PRECONDITIONING OF NONHERMETIC SURFACE MOUNT DEVICES PRIOR TO RELIABILITY TESTING
standard by JEDEC Solid State Technology Association, 11/01/2016
Universal Flash Storage (UFS)
standard by JEDEC Solid State Technology Association, 02/01/2011
A Guideline for Defining "Low-Halogen" Solid State Devices (Removal of BFR/CFR/PVC)
standard by JEDEC Solid State Technology Association, 11/01/2010
PREFERRED LEAD CONFIGURATION FOR FIELD-EFFECT TRANSISTORS
standard by JEDEC Solid State Technology Association, 11/01/1973
SPECIAL REQUIREMENTS FOR MAVERICK PRODUCT ELIMINATION AND OUTLIER MANAGEMENT
standard by JEDEC Solid State Technology Association, 01/01/2018
Multi-wire Multi-level I/O Standard
standard by JEDEC Solid State Technology Association, 06/01/2016
Universal Flash Storage Host Controller Interface (UFSHCI), Unified Memory Extension
standard by JEDEC Solid State Technology Association, 09/01/2013