JEDEC JESD 22-A118 (R2008)

ACCELERATED MOISTURE RESISTANCE – UNBIASED HAST
standard by JEDEC Solid State Technology Association, 12/01/2000

JEDEC JESD213A

STANDARD TEST METHOD UTILIZING X-RAY FLUORESCENCE (XRF) FOR ANALYZING COMPONENT FINISHES AND SOLDER ALLOYS TO DETERMINE TIN (Sn) – LEAD (Pb) CONTENT
standard by JEDEC Solid State Technology Association, 04/01/2017

JEDEC JESD22-B113B

BOARD LEVEL CYCLIC BEND TEST METHOD FOR INTERCONNECT RELIABILITY CHARACTERIZATION OF SMT ICS FOR HANDHELD ELECTRONIC PRODUCTS
standard by JEDEC Solid State Technology Association, 08/01/2018

JEDEC JESD 22-A108C

TEMPERATURE, BIAS, AND OPERATING LIFE
standard by JEDEC Solid State Technology Association, 06/01/2005

JEDEC JESD 35-1

ADDENDUM No. 1 to JESD35 – GENERAL GUIDELINES FOR DESIGNING TEST STRUCTURES FOR THE WAFER-LEVEL TESTING OF THIN DIELECTRICS
standard by JEDEC Solid State Technology Association, 09/01/1995

JEDEC JESD76-1

STANDARD DESCRIPTION OF 1.2 V CMOS LOGIC DEVICES (WIDE RANGE OPERATION)
standard by JEDEC Solid State Technology Association, 06/01/2001

JEDEC JESD22-A113H

PRECONDITIONING OF NONHERMETIC SURFACE MOUNT DEVICES PRIOR TO RELIABILITY TESTING
standard by JEDEC Solid State Technology Association, 11/01/2016

JEDEC JESD220

Universal Flash Storage (UFS)
standard by JEDEC Solid State Technology Association, 02/01/2011

JEDEC JEP709

A Guideline for Defining "Low-Halogen" Solid State Devices (Removal of BFR/CFR/PVC)
standard by JEDEC Solid State Technology Association, 11/01/2010

JEDEC JEP69-B (R1999)

PREFERRED LEAD CONFIGURATION FOR FIELD-EFFECT TRANSISTORS
standard by JEDEC Solid State Technology Association, 11/01/1973