JEDEC JESD 82-25
DEFINITION OF the SSTUB32866 1.8 V CONFIGURABLE REGISTERED BUFFER WITH PARITY FOR DDR2 RDIMM APPLICATIONS
standard by JEDEC Solid State Technology Association, 05/01/2007
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DEFINITION OF the SSTUB32866 1.8 V CONFIGURABLE REGISTERED BUFFER WITH PARITY FOR DDR2 RDIMM APPLICATIONS
standard by JEDEC Solid State Technology Association, 05/01/2007
RELATIVE SPECTRAL RESPONSE CURVES FOR SEMICONDUCTOR INFRARED DETECTORS
standard by JEDEC Solid State Technology Association, 10/01/1969
ZENER AND VOLTAGE REGULATOR DIODE RATING VERIFICATION AND CHARACTERIZATION TESTING
standard by JEDEC Solid State Technology Association, 12/01/2009
HIGH TEMPERATURE STORAGE LIFE
standard by JEDEC Solid State Technology Association, 10/01/2015
Implementation of the Electrical Test Method for the Measurement of Real Thermal Resistance and Impedance of Light-emitting Diodes with Exposed Cooling Surface
standard by JEDEC Solid State Technology Association, 04/18/2012
NAND Flash Interface Interoperability
standard by JEDEC Solid State Technology Association, 10/01/2012
ACCELERATED MOISTURE RESISTANCE – UNBIASED HAST
standard by JEDEC Solid State Technology Association, 07/01/2015
HIGH EFFECTIVE THERMAL CONDUCTIVITY TEST BOARD FOR LEADED SURFACE MOUNT PACKAGES
standard by JEDEC Solid State Technology Association, 02/01/1999
DEFINITION OF the SSTUA32S869 AND SSTUA32D869 REGISTERED BUFFER WITH PARITY FOR DDR2 RDIMM APPLICATIONS
standard by JEDEC Solid State Technology Association, 05/01/2007
AVALANCHE BREAKDOWN DIODE (ABD) TRANSIENT VOLTAGE SUPPRESSORS
standard by JEDEC Solid State Technology Association, 03/01/2017