JEDEC JESD8-21B

POD135 – 1.35 V PSEUDO OPEN DRAIN I/O
standard by JEDEC Solid State Technology Association, 03/01/2018

JEDEC JESD22-A110E

HIGHLY ACCELERATED TEMPERATURE AND HUMIDITY STRESS TEST (HAST)
standard by JEDEC Solid State Technology Association, 07/01/2015

JEDEC JESD 12-6

ADDENDUM No. 6 to JESD12 – INTERFACE STANDARD FOR SEMICUSTOM INTEGRATED CIRCUITS
Amendment by JEDEC Solid State Technology Association, 03/01/1991

JEDEC JESD20

STANDARD FOR DESCRIPTION OF 54/74ACXXXXX AND 54/74ACTXXXXX ADVANCED HIGH-SPEED CMOS DEVICES
standard by JEDEC Solid State Technology Association, 09/01/1990

JEDEC JESD213

STANDARD TEST METHOD UTILIZING X-RAY FLUORESCENCE (XRF) FOR ANALYZING COMPONENT FINISHES AND SOLDER ALLOYS TO DETERMINE TIN (Sn) – LEAD (Pb) CONTENT
standard by JEDEC Solid State Technology Association, 03/01/2010

JEDEC JESD209-2F

Low Power Double Data Rate 2 (LPDDR2)
standard by JEDEC Solid State Technology Association, 06/01/2013

JEDEC JESD219A_MT

Master Trace for 128 GB SSD
Directive by JEDEC Solid State Technology Association, 07/01/2012

JEDEC JESD47H

STRESS-TEST-DRIVEN QUALIFICATION OF INTEGRATED CIRCUITS
standard by JEDEC Solid State Technology Association, 02/01/2011

JEDEC JESD237

Reliability Qualification of Power Amplifier Modules
standard by JEDEC Solid State Technology Association, 03/01/2014

JEDEC JESD51-53

TERMS, DEFINITIONS AND UNITS GLOSSARY FOR LED THERMAL TESTING
standard by JEDEC Solid State Technology Association, 05/01/2012