TEST METHODS FOR THE COLLECTOR-BASE TIME CONSTANT AND FOR THE RESISTIVE PART OF THE COMMON-EMITTER INPUT IMPEDANCE
standard by JEDEC Solid State Technology Association, 11/01/1963
STANDARD DESCRIPTION OF LOW-VOLTAGE TTL-COMPATIBLE, 5 V TOLERANT CMOS LOGIC DEVICES
standard by JEDEC Solid State Technology Association, 06/01/1996
N-CHANNEL MOSFET HOT CARRIER DATA ANALYSIS
standard by JEDEC Solid State Technology Association, 09/01/2001
Joint JEDEC/ECA Standard: Definition of "Low-Halogen" for Electronic Products
standard by JEDEC Solid State Technology Association, 03/01/2018
GENERAL REQUIREMENTS FOR DISTRIBUTORS OF COMMERCIAL AND MILITARY SEMICONDUCTOR DEVICES
standard by JEDEC Solid State Technology Association, 09/01/2010
ADDENDUM No. 10 to JESD24 – TEST METHOD FOR MEASUREMENT OF REVERSE RECOVERY TIME trr FOR POWER MOSFET DRAIN-SOURCE DIODES
Amendment by JEDEC Solid State Technology Association, 08/01/1994
JOINT IPC/JEDEC STANDARD FOR ACOUSTIC MICROSCOPY FOR NONHERMETRIC ENCAPSULATED ELECTRONIC COMPONENTS
standard by JEDEC Solid State Technology Association, 05/01/1999
BOARD LEVEL CYCLIC BEND TEST METHOD FOR INTERCONNECT RELIABILITY CHARACTERIZATION OF COMPONENTS FOR HANDHELD ELECTRONIC PRODUCTS
standard by JEDEC Solid State Technology Association, 03/01/2006
Universal Flash Storage (UFS) Test
standard by JEDEC Solid State Technology Association, 07/01/2017
DEFINITION OF THE SSTV16857 2.5 V, 14-BIT SSTL_2 REGISTERED BUFFER FOR DDR DIMM APPLICATIONS
standard by JEDEC Solid State Technology Association, 11/01/2004
