JEDEC JEP 148A
RELIABILITY QUALIFICATION OF SEMICONDUCTOR DEVICES BASED ON PHYSICS OF FAILURE RISK AND OPPORTUNITY ASSESSMENT
standard by JEDEC Solid State Technology Association, 12/01/2008
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RELIABILITY QUALIFICATION OF SEMICONDUCTOR DEVICES BASED ON PHYSICS OF FAILURE RISK AND OPPORTUNITY ASSESSMENT
standard by JEDEC Solid State Technology Association, 12/01/2008
SON/QFN PACKAGE PINOUTS STANDARDIZED FOR 1-, 2-, AND 3-BIT LOGIC FUNCTIONS
standard by JEDEC Solid State Technology Association, 07/01/2004
NAND Flash Interface Interoperability
standard by JEDEC Solid State Technology Association, 10/01/2016
HIGHLY ACCELERATED TEMPERATURE AND HUMIDITY STRESS TEST (HAST)
standard by JEDEC Solid State Technology Association, 11/01/2010
TEST METHODS FOR THE COLLECTOR-BASE TIME CONSTANT AND FOR THE RESISTIVE PART OF THE COMMON-EMITTER INPUT IMPEDANCE
standard by JEDEC Solid State Technology Association, 11/01/1963
.05 Low Voltage Swing Terminated Logic (LVSTL05)
standard by JEDEC Solid State Technology Association, 06/01/2019
ADDENDUM No. 4 to JESD12 – METHOD OF SPECIFICATION OF PERFORMANCE PARAMETERS FOR CMOS SEMICUSTOM INTEGRATED CIRCUITS
Amendment by JEDEC Solid State Technology Association, 04/01/1987
PROCESS FAILURE MODE AND EFFECTS ANALYSIS (FMEA)
standard by JEDEC Solid State Technology Association, 05/01/2005
STANDARD FOR DESCRIPTION OF 3867 – 2.5 V, SINGLE 10-BIT, 2-PORT, DDR FET SWITCH
standard by JEDEC Solid State Technology Association, 11/01/2001
SOLDER BALL PULL
standard by JEDEC Solid State Technology Association, 07/01/2016