JEDEC JESD75-5

SON/QFN PACKAGE PINOUTS STANDARDIZED FOR 1-, 2-, AND 3-BIT LOGIC FUNCTIONS
standard by JEDEC Solid State Technology Association, 07/01/2004

JEDEC JESD230C

NAND Flash Interface Interoperability
standard by JEDEC Solid State Technology Association, 10/01/2016

JEDEC JESD22-A110D

HIGHLY ACCELERATED TEMPERATURE AND HUMIDITY STRESS TEST (HAST)
standard by JEDEC Solid State Technology Association, 11/01/2010

JEDEC JESD284-A (R2002)

TEST METHODS FOR THE COLLECTOR-BASE TIME CONSTANT AND FOR THE RESISTIVE PART OF THE COMMON-EMITTER INPUT IMPEDANCE
standard by JEDEC Solid State Technology Association, 11/01/1963

JEDEC JESD 36

STANDARD DESCRIPTION OF LOW-VOLTAGE TTL-COMPATIBLE, 5 V TOLERANT CMOS LOGIC DEVICES
standard by JEDEC Solid State Technology Association, 06/01/1996

JEDEC JESD73-3

STANDARD FOR DESCRIPTION OF 3867 – 2.5 V, SINGLE 10-BIT, 2-PORT, DDR FET SWITCH
standard by JEDEC Solid State Technology Association, 11/01/2001

JEDEC JESD22-B115A.01

SOLDER BALL PULL
standard by JEDEC Solid State Technology Association, 07/01/2016

JEDEC JESD22-A100C

CYCLED TEMPERATURE HUMIDITY BIAS LIFE TEST
standard by JEDEC Solid State Technology Association, 10/01/2007

JEDEC JESD 24-10 (R2002)

ADDENDUM No. 10 to JESD24 – TEST METHOD FOR MEASUREMENT OF REVERSE RECOVERY TIME trr FOR POWER MOSFET DRAIN-SOURCE DIODES
Amendment by JEDEC Solid State Technology Association, 08/01/1994

JEDEC J-STD-035

JOINT IPC/JEDEC STANDARD FOR ACOUSTIC MICROSCOPY FOR NONHERMETRIC ENCAPSULATED ELECTRONIC COMPONENTS
standard by JEDEC Solid State Technology Association, 05/01/1999