JEDEC JEP 148A

RELIABILITY QUALIFICATION OF SEMICONDUCTOR DEVICES BASED ON PHYSICS OF FAILURE RISK AND OPPORTUNITY ASSESSMENT
standard by JEDEC Solid State Technology Association, 12/01/2008

JEDEC JESD75-5

SON/QFN PACKAGE PINOUTS STANDARDIZED FOR 1-, 2-, AND 3-BIT LOGIC FUNCTIONS
standard by JEDEC Solid State Technology Association, 07/01/2004

JEDEC JESD230C

NAND Flash Interface Interoperability
standard by JEDEC Solid State Technology Association, 10/01/2016

JEDEC JESD22-A110D

HIGHLY ACCELERATED TEMPERATURE AND HUMIDITY STRESS TEST (HAST)
standard by JEDEC Solid State Technology Association, 11/01/2010

JEDEC JESD284-A (R2002)

TEST METHODS FOR THE COLLECTOR-BASE TIME CONSTANT AND FOR THE RESISTIVE PART OF THE COMMON-EMITTER INPUT IMPEDANCE
standard by JEDEC Solid State Technology Association, 11/01/1963

JEDEC JESD8-33

.05 Low Voltage Swing Terminated Logic (LVSTL05)
standard by JEDEC Solid State Technology Association, 06/01/2019

JEDEC JESD 12-4

ADDENDUM No. 4 to JESD12 – METHOD OF SPECIFICATION OF PERFORMANCE PARAMETERS FOR CMOS SEMICUSTOM INTEGRATED CIRCUITS
Amendment by JEDEC Solid State Technology Association, 04/01/1987

JEDEC JEP131A

PROCESS FAILURE MODE AND EFFECTS ANALYSIS (FMEA)
standard by JEDEC Solid State Technology Association, 05/01/2005

JEDEC JESD73-3

STANDARD FOR DESCRIPTION OF 3867 – 2.5 V, SINGLE 10-BIT, 2-PORT, DDR FET SWITCH
standard by JEDEC Solid State Technology Association, 11/01/2001

JEDEC JESD22-B115A.01

SOLDER BALL PULL
standard by JEDEC Solid State Technology Association, 07/01/2016