JEDEC JESD22-A108E
TEMPERATURE, BIAS, AND OPERATING LIFE
standard by JEDEC Solid State Technology Association, 12/01/2016
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TEMPERATURE, BIAS, AND OPERATING LIFE
standard by JEDEC Solid State Technology Association, 12/01/2016
REFERENCE GUIDE TO LETTER SYMBOLS FOR SEMICONDUCTOR DEVICES
standard by JEDEC Solid State Technology Association, 05/01/2003
ASSESSMENT OF AVERAGE OUTGOING QUALITY LEVELS IN PARTS PER MILLION (PPM)
standard by JEDEC Solid State Technology Association, 04/01/1995
GUIDELINES FOR REPORTING AND USING ELECTRONIC PACKAGE THERMAL INFORMATION
standard by JEDEC Solid State Technology Association, 11/01/2012
ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING MACHINE MODEL (MM)
standard by JEDEC Solid State Technology Association, 11/01/2010
Graphics Double Data Rate (GDDR6) SGRAM Standard
standard by JEDEC Solid State Technology Association, 07/01/2018
BALL GRID ARRAY PINOUT FOR 1-, 2-, AND 3-BIT LOGIC FUNCTIONS
standard by JEDEC Solid State Technology Association, 03/01/2004
Seriel Flash Discoverable Parameters (SFDP)
standard by JEDEC Solid State Technology Association, 11/01/2018
COPLANARITY TEST FOR SURFACE-MOUNT SEMICONDUCTOR DEVICES
standard by JEDEC Solid State Technology Association, 09/01/2010
Lead Integrity
standard by JEDEC Solid State Technology Association, 02/01/2018