JEDEC JESD8-21C
POD135 – 1.35 V Pseudo Open Drain I/O
standard by JEDEC Solid State Technology Association, 06/01/2019
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POD135 – 1.35 V Pseudo Open Drain I/O
standard by JEDEC Solid State Technology Association, 06/01/2019
MECHANICAL COMPRESSIVE STATIC STRESS TEST METHODS
standard by JEDEC Solid State Technology Association, 10/01/2018
PROCEDURE FOR THE EVQLUQTION OF LOW-k/METAL INTER/INTRA-LEVEL DIELECTRIC INTEGRITY
standard by JEDEC Solid State Technology Association, 08/01/2010
Byte Addressable Energy Backed Interface
standard by JEDEC Solid State Technology Association, 07/01/2017
REFERENCE GUIDE TO LETTER SYMBOLS FOR SEMICONDUCTOR DEVICES
standard by JEDEC Solid State Technology Association, 05/01/2003
TEMPERATURE, BIAS, AND OPERATING LIFE
standard by JEDEC Solid State Technology Association, 12/01/2016
ASSESSMENT OF AVERAGE OUTGOING QUALITY LEVELS IN PARTS PER MILLION (PPM)
standard by JEDEC Solid State Technology Association, 04/01/1995
GUIDELINES FOR REPORTING AND USING ELECTRONIC PACKAGE THERMAL INFORMATION
standard by JEDEC Solid State Technology Association, 11/01/2012
ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING MACHINE MODEL (MM)
standard by JEDEC Solid State Technology Association, 11/01/2010
Embedded Multi-media card (e*MMC), Electrical Standard (5.1)
standard by JEDEC Solid State Technology Association, 02/01/2015