JEDEC JEP 79
LIFE TEST METHODS FOR PHOTOCONDUCTIVE CELLS
standard by JEDEC Solid State Technology Association, 09/01/1969
- Comments Off on JEDEC JEP 79
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LIFE TEST METHODS FOR PHOTOCONDUCTIVE CELLS
standard by JEDEC Solid State Technology Association, 09/01/1969
FBDIMM STANDARD: DDR2 SDRAM FULLY BUFFERED DIMM (FBDIMM) DESIGN SPECIFICATION
standard by JEDEC Solid State Technology Association, 03/01/2007
PROCEDURE FOR MEASURING INPUT CAPACITANCE USING A VECTOR NETWORK ANALYZER (VNA)
standard by JEDEC Solid State Technology Association, 10/01/2003
Potential Failure Mode and Effects Analysis (FMEA)
standard by JEDEC Solid State Technology Association, 08/01/2018
ADDENDUM No. 5 to JESD24 – SINGLE PULSE UNCLAMPED INDUCTIVE SWITCHING (UIS) AVALANCHE TEST METHOD
Amendment by JEDEC Solid State Technology Association, 08/01/1990
ADAPTER TEST BOARD RELIABILITY TEST GUIDELINES
standard by JEDEC Solid State Technology Association, 01/01/2018
CONSTANT-TEMPERATURE AGING METHOD TO CHARACTERIZE COPPER INTERCONNECT METALLIZATIONS FOR STRESS-INDUCED VOIDING
standard by JEDEC Solid State Technology Association, 08/01/2017
ADDENDUM No. 4 to JESD24 – THERMAL IMPEDANCE MEASUREMENTS FOR BIPOLAR TRANSISTORS (DELTA BASE-EMITTER VOLTAGE METHOD)
Amendment by JEDEC Solid State Technology Association, 11/01/1990
MEASUREMENT OF REVERSE RECOVERY TIME FOR SEMICONDUCTOR SIGNAL DIODES
standard by JEDEC Solid State Technology Association, 07/01/1996
LEADLESS CHIP CARRIER PINOUTS STANDARDIZED FOR LINEARS
standard by JEDEC Solid State Technology Association, 04/01/1982