JEDEC JEP163

SELECTION OF BURN-IN/LIFE TEST CONDITIONS AND CRITICAL PARAMETERS FOR QML MICROCIRCUITS
standard by JEDEC Solid State Technology Association, 09/01/2015

JEDEC JESD4 (R2002)

DEFINITION OF EXTERNAL CLEARANCE AND CREEPAGE DISTANCES OF DISCRETE SEMICONDUCTOR PACKAGES FOR THYRISTORS AND RECTIFIER DIODES
standard by JEDEC Solid State Technology Association, 11/01/1983

JEDEC JESD 27

CERAMIC PACKAGE SPECIFICATION FOR MICROELECTRONIC PACKAGES
standard by JEDEC Solid State Technology Association, 08/01/1993

JEDEC JESD51-50

Overview of Methodologies for the Thermal Measurement of Single- and Multi-Chip, Single- and Multi-PN-Junction Light-Emotting Diodes (LEDs)
standard by JEDEC Solid State Technology Association, 04/18/2012

JEDEC JESD22-A102E

ACCELERATED MOISTURE RESISTANCE – UNBIASED AUTOCLAVE
standard by JEDEC Solid State Technology Association, 07/01/2015

JEDEC JESD10 (R2002)

LOW FREQUENCY POWER TRANSISTORS
standard by JEDEC Solid State Technology Association, 01/01/1976

JEDEC JEB 19

RECOMMENDED CHARACTERIZATION OF MOS SHIFT REGISTERS
standard by JEDEC Solid State Technology Association, 11/01/1972

JEDEC JESD220C

Universal Flash Storage (UFS)
standard by JEDEC Solid State Technology Association, 03/01/2016

JEDEC JESD86A

ELECTRICAL PARAMETERS ASSESSMENT
standard by JEDEC Solid State Technology Association, 10/01/2009

JEDEC JESD82-6A

DEFINITION OF THE SSTV32852 2.5 V 24-BIT TO 48-BIT SSTL_2 REGISTERED BUFFER FOR 1U STACKED DDR DIMM APPLICATIONS
standard by JEDEC Solid State Technology Association, 11/01/2004