JEDEC JEP163

SELECTION OF BURN-IN/LIFE TEST CONDITIONS AND CRITICAL PARAMETERS FOR QML MICROCIRCUITS
standard by JEDEC Solid State Technology Association, 09/01/2015

JEDEC JESD 27

CERAMIC PACKAGE SPECIFICATION FOR MICROELECTRONIC PACKAGES
standard by JEDEC Solid State Technology Association, 08/01/1993

JEDEC JESD4 (R2002)

DEFINITION OF EXTERNAL CLEARANCE AND CREEPAGE DISTANCES OF DISCRETE SEMICONDUCTOR PACKAGES FOR THYRISTORS AND RECTIFIER DIODES
standard by JEDEC Solid State Technology Association, 11/01/1983

JEDEC JEB 19

RECOMMENDED CHARACTERIZATION OF MOS SHIFT REGISTERS
standard by JEDEC Solid State Technology Association, 11/01/1972

JEDEC JESD220C

Universal Flash Storage (UFS)
standard by JEDEC Solid State Technology Association, 03/01/2016

JEDEC JESD86A

ELECTRICAL PARAMETERS ASSESSMENT
standard by JEDEC Solid State Technology Association, 10/01/2009

JEDEC JESD82-6A

DEFINITION OF THE SSTV32852 2.5 V 24-BIT TO 48-BIT SSTL_2 REGISTERED BUFFER FOR 1U STACKED DDR DIMM APPLICATIONS
standard by JEDEC Solid State Technology Association, 11/01/2004

JEDEC J-STD-033D

Handling, Packing, Shipping, and Use of Moisture/Reflow Sensitive Surface-Mount Devices
standard by JEDEC Solid State Technology Association, 04/01/2018

JEDEC JESD14 (R2002)

SEMICONDUCTOR POWER CONTROL MODULES
standard by JEDEC Solid State Technology Association, 11/01/1986

JEDEC JESD 212

GDDR5 SGRAM
standard by JEDEC Solid State Technology Association, 09/01/2009