JEDEC JESD51-6
INTEGRATED CIRCUIT THERMAL TEST METHOD ENVIRONMENTAL CONDITIONS – FORCED CONVECTION (MOVING AIR)
standard by JEDEC Solid State Technology Association, 03/01/1999
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INTEGRATED CIRCUIT THERMAL TEST METHOD ENVIRONMENTAL CONDITIONS – FORCED CONVECTION (MOVING AIR)
standard by JEDEC Solid State Technology Association, 03/01/1999
HIgh Bandwidth Memory (HBM) DRAM
standard by JEDEC Solid State Technology Association, 11/01/2015
PRECONDITIONING OF PLASTIC SURFACE MOUNT DEVICES PRIOR TO RELIABILITY TESTING
standard by JEDEC Solid State Technology Association, 10/01/2015
System Level ESD: Part II: Implementation of Effective ESD Robust Designs
standard by JEDEC Solid State Technology Association, 01/01/2013
INFORMATION REQUIREMENTS FOR THE QUALIFICATION OF SILICON DEVICES
standard by JEDEC Solid State Technology Association, 10/01/2007
DDR2 SPD INTERPRETATION OF TEMPERATURE RANGE AND (SELF-) REFRESH OPERATION
standard by JEDEC Solid State Technology Association, 06/01/2006
TEMPERATURE, BIAS, AND OPERATING LIFE
standard by JEDEC Solid State Technology Association, 11/01/2010
LIST OF PREFERRED VALUES FOR USE ON VARIOUS TYPES OF SMALL SIGNAL AND REGULATOR DIODES
standard by JEDEC Solid State Technology Association, 08/01/1984
TEMPERATURE CYCLING
standard by JEDEC Solid State Technology Association, 10/01/2014
SOLID STATE DRIVE (SSD) REQUIREMENTS AND ENDURANCE TEST METHOD
standard by JEDEC Solid State Technology Association, 03/01/2016