JEDEC JESD 8-22
HSUL_12 LPDDR2 I/O
standard by JEDEC Solid State Technology Association, 08/01/2009
- Comments Off on JEDEC JESD 8-22
- JEDEC
HSUL_12 LPDDR2 I/O
standard by JEDEC Solid State Technology Association, 08/01/2009
PROCESS CHARACTERIZATION GUIDELINE
standard by JEDEC Solid State Technology Association, 07/01/1998
EMBEDDED MULTIMEDIACARD (e*MMC) e*MMC/CARD PRODUCT STANDARD, HIGH CAPACITY, INCLUDING RELIABLE WRITE, BOOT, AND SLEEP MODES (MMCA, 4.3)
standard by JEDEC Solid State Technology Association, 12/01/2007
SOLID STATE RELIABILITY ASSESSMENT QUALIFICATION METHODOLOGIES
standard by JEDEC Solid State Technology Association, 07/01/2012
Universal Flash Storage (UFS)
standard by JEDEC Solid State Technology Association, 06/01/2012
STUB SERIES TERMINATED LOGIC FOR 1.8 V (SSTL_18)
standard by JEDEC Solid State Technology Association, 09/01/2003
ADDENDUM No. 2 to JESD35 – TEST CRITERIA FOR THE WAFER-LEVEL TESTING OF THIN DIELECTRICS
standard by JEDEC Solid State Technology Association, 02/01/1996
FAILURE-MECHANISM-DRIVEN RELIABILITY MONITORING
standard by JEDEC Solid State Technology Association, 02/01/2007
EXTENSION OF THERMAL TEST BOARD STANDARDS FOR PACKAGES WITH DIRECT THERMAL ATTACHMENT MECHANISMS
standard by JEDEC Solid State Technology Association, 02/01/1999
MARKING PERMANENCY
standard by JEDEC Solid State Technology Association, 03/01/2011