JEDEC JESD22-B111A
BOARD LEVEL DROP TEST METHOD OF COMPONENTS FOR HANDHELD ELECTRONIC PRODUCTS
standard by JEDEC Solid State Technology Association, 11/01/2016
- Comments Off on JEDEC JESD22-B111A
- JEDEC
BOARD LEVEL DROP TEST METHOD OF COMPONENTS FOR HANDHELD ELECTRONIC PRODUCTS
standard by JEDEC Solid State Technology Association, 11/01/2016
FIELD-INDUCED CHARGED-DEVICE MODEL TEST METHOD FOR ELECTROSTATIC DISCHARGE WITHSTAND THRESHOLDS OF MICROELECTRONIC COMPONENTS
standard by JEDEC Solid State Technology Association, 10/01/2013
DDR4 SDRAM Standard
standard by JEDEC Solid State Technology Association, 09/01/2012
DDR4 NVDIMM-N Design Standard
standard by JEDEC Solid State Technology Association, 09/01/2016
STANDARD FOR DESCRIPTION OF A 3.3 V, 18-BIT, LVTTL I/O REGISTER FOR PC133 REGISTERED DIMM APPLICATIONS
standard by JEDEC Solid State Technology Association, 07/01/2001
SOLDER BALL SHEAR
standard by JEDEC Solid State Technology Association, 05/01/2014
PRODUCT DISCONTINUANCE
standard by JEDEC Solid State Technology Association, 12/01/2011
UNDERSTANDING ELECTRICAL OVERSTRESS – EOS
standard by JEDEC Solid State Technology Association, 09/01/2016
GENERAL REQUIREMENTS FOR DISTRIBUTORS OF COMMERCIAL AND MILITARY SEMICONDUCTOR DEVICES
standard by JEDEC Solid State Technology Association, 09/01/2012
STANDARD FOR DESCRIPTION OF 3.3 V NFET BUS SWITCH DEVICES
standard by JEDEC Solid State Technology Association, 08/01/2001