NUMBERING OF LIKE-NAMED TERMINAL FUNCTIONS IN SEMICONDUCTOR DEVICES AND DESIGNATION OF UNITS IN MULTIPLE-UNIT SEMICONDUCTOR DEVICES
standard by JEDEC Solid State Technology Association, 02/01/1987
ANSI/ESDA/JEDEC Joint Standard for Electrostatic Discharge Sensitivity Testing, Charged Device MOdel (CDM) – Device Level
standard by JEDEC Solid State Technology Association, 04/07/2015
DDR2 DIMM CLOCK SKEW MEASUREMENT PROCEDURE USING A CLOCK REFERENCE BOARD
standard by JEDEC Solid State Technology Association, 05/01/2007
, Test Procedure for the Measurement of Terrestrial Cosmic Ray Induced Destructive Effects in Power Semiconductor Devices
standard by JEDEC Solid State Technology Association, 12/01/2015
JOINT IPC/JEDEC STANDARD FOR MOISTURE/REFLOW SENSITIVITY CLASSIFICATION FOR NONHERMETIC SOLID STATE SURFACE-MOUNT DEVICES
standard by JEDEC Solid State Technology Association, 12/01/2014
Universal Flash Storage Host Controller Interface (UFSHCI)
standard by JEDEC Solid State Technology Association, 09/01/2013
FAILURE MECHANISMS AND MODELS FOR SEMICONDUCTOR DEVICES
standard by JEDEC Solid State Technology Association, 11/01/2010
STANDARD MANUFACTURERS IDENTIFICATION CODE
standard by JEDEC Solid State Technology Association, 04/01/2009
GUIDELINES FOR PARTICLE IMPACT NOISE DETECTION (PIND) TESTING, OPERATOR TRAINING, AND CERTIFICATION
standard by JEDEC Solid State Technology Association, 10/01/2007
NAND Flash Interface Interoperability
standard by JEDEC Solid State Technology Association, 10/01/2012
