IEC 60646 Ed. 2.0 b:1992
Test methods for crucible induction furnaces
standard by International Electrotechnical Commission, 06/15/1992
- Comments Off on IEC 60646 Ed. 2.0 b:1992
- IEC
Test methods for crucible induction furnaces
standard by International Electrotechnical Commission, 06/15/1992
Electrical insulating materials – Determination of the effects of ionizing radiation – Part 5: Procedures for assessment of ageing in service
standard by International Electrotechnical Commission, 02/17/2003
Amendment 2 – Automatic electrical controls for household and similar use – Part 2-17: Particular requirements for electrically operated gas valves, including mechanical requirements
Amendment by International Electrotechnical Commission, 08/29/2007
Fixed capacitors for use in electronic equipment – Part 8-1: Blank detail specification: Fixed capacitors of ceramic dielectric, Class 1 – Assessment level EZ
standard by International Electrotechnical Commission, 05/19/2005
Corrigendum 1 – Fixed capacitors for use in electronic equipment – Part 24: Sectional specification – Surface mount fixed tantalum electrolytic capacitors with conductive polymer solid electrolyte
Corrigenda by International Electrotechnical Commission, 10/24/2006
Amendment 1 – Specification for insulating materials based on mica – Part 3: Specifications for individual materials – Sheet 4: Polyester film-backed mica paper with a B-stage epoxy resin binder
standard by International Electrotechnical Commission, 09/27/2006
Household and similar electrical appliances – Safety – Part 2-89: Particular requirements for commercial refrigerating appliances withan incorporated or remote refrigerant unit or compressor
standard by International Electrotechnical Commission, 06/01/2019
Amendment 2 – Household and similar electrical appliances – Safety – Part 2-79: Particular requirements for high pressure cleaners and steam cleaners
Amendment by International Electrotechnical Commission, 07/25/2007
Optical fibres – Part 1-43: Measurement methods and test procedures – Numerical aperture measurement
standard by International Electrotechnical Commission, 03/27/2015
Connectors for electronic equipment – Tests and measurements – Part 16-1: Mechanical tests on contacts and terminations – Test 16a: Probe damage
standard by International Electrotechnical Commission, 06/11/2008