IEC 61139-2 Ed. 1.0 b:2022

Industrial networks – Single-drop digital communication interface – Part 2: Functional safety extensions
standard by International Electrotechnical Commission, 08/01/2022

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IEC 60966-4-3 Ed. 1.0 b:2022

Radio frequency and coaxial cable assemblies – Part 4-3: Detail specification for semi-rigid cable assemblies – Frequency range up to 6 000 MHz, type 50-12 low loss semi-rigid coaxial cable
standard by International Electrotechnical Commission, 06/01/2022

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IEC 62196-6 Ed. 1.0 b:2022

Plugs, socket-outlets, vehicle connectors and vehicle inlets – Conductive charging of electric vehicles – Part 6: Dimensional compatibility requirements for DC pin and contact-tube vehicle couplers intended to be used for DC EV supply equipment where protection relies on electrical separation
standard by International Electrotechnical Commission, 04/01/2022

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IEC 62067 Ed. 3.0 b:2022

Power cables with extruded insulation and their accessories for rated voltages above 150 kV (Um = 170 kV) up to 500 kV (Um = 550 kV) – Test methods and requirements
standard by International Electrotechnical Commission, 04/01/2022

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IEC 60974-12 Ed. 4.0 b:2022

Arc welding equipment – Part 12: Coupling devices for welding cables
standard by International Electrotechnical Commission, 07/01/2022

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IEC 60086-1 Ed. 13.0 Cor. 1 b:2022

Corrigendum 1 to Primary batteries – Part 1: General
Amendment by International Electrotechnical Commission, 06/01/2022

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IEC 60747-5-4 Ed. 2.0 en:2022

Semiconductor devices – Discrete devices – Part 5-4: Optoelectronic devices – Semiconductor lasers
standard by International Electrotechnical Commission, 04/01/2022

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IEC 62788-7-3 Ed. 1.0 b:2022

Measurement procedures for materials used in photovoltaic modules – Part 7-3: Accelerated stress tests – Methods of abrasion of PV module external surfaces
standard by International Electrotechnical Commission, 02/01/2022

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IEC 63275-1 Ed. 1.0 b:2022

Semiconductor devices – Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors – Part 1: Test method for bias temperature instability
standard by International Electrotechnical Commission, 04/01/2022

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IEC 63203-201-1 Ed. 1.0 b:2022

Wearable electronic devices and technologies -Part 201-1: Electronic textile – Measurement methods for basic properties of conductive yarns
standard by International Electrotechnical Commission, 04/01/2022

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