IEC 60050-891 Amd.1 Ed. 1.0 b:2018

Amendment 1 – International Electrotechnical Vocabulary (IEV) – Part 891: Electrobiology
Amendment by International Electrotechnical Commission, 10/17/2018

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IEC 13249-2 Ed. 1.0 en:2000

Information technology — Database languages — SQL multimedia and application packages — Part 2: Full-Text
standard by International Electrotechnical Commission, 10/10/2000

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IEC 60317-0-8 Ed. 2.0 b:2019

Specifications for particular types of winding wires – Part 0-8: General requirements – Polyester glass fibre wound, resin or varnish impregnated or not impregnated, bare or enamelled rectangular copper wire
standard by International Electrotechnical Commission, 08/20/2019

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IEC 60127-1 Ed. 2.0 en:2006

Miniature fuses – Part 1: Definitions for miniature fuses and general requirements for miniature fuse-links
standard by International Electrotechnical Commission, 06/13/2006

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IEC 60191-3 Ed. 2.0 b:1999

Mechanical standardization of semiconductor devices – Part 3: General rules for the preparation of outline drawings of integrated circuits
standard by International Electrotechnical Commission, 10/29/1999

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IEC 60050-394 Amd.1 Ed. 1.0 b:1996

Amendment 1 – International Electrotechnical Vocabulary – Chapter 394: Nuclear instrumentation: Instruments
Amendment by International Electrotechnical Commission, 04/18/1996

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IEC 60195 Ed. 1.0 b:1965

Method of measurement of current noise generated in fixed resistors
standard by International Electrotechnical Commission, 01/01/1965

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IEC 60191-2Z Ed. 1.0 en:2000

Twenty-fourth supplement to Publication 60191-2 (1966) MECHANICAL STANDARDIZATION OF SEMICONDUCTOR DEVICES – Part 2: Dimensions
standard by International Electrotechnical Commission, 09/29/2000

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IEC 60255-22-4 Ed. 3.0 b:2008

Measuring relays and protection equipment – Part 22-4: Electrical disturbance tests – Electrical fast transient/burst immunity test
standard by International Electrotechnical Commission, 04/14/2008

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IEC 60191-2Z Ed. 1.0 b:2000

Twenty-fourth supplement – Mechanical standardization of semiconductor devices – Part 2: Dimensions
standard by International Electrotechnical Commission, 09/29/2000

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