IEC 60205 Ed. 3.0 b:2006

Calculation of the effective parameters of magnetic piece parts
standard by International Electrotechnical Commission, 04/26/2006

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IEC 60051-4 Ed. 5.0 b:2018

Direct acting indicating analogue electrical measuring instruments and their accessories title – Part 4: Special requirements for frequency meters
standard by International Electrotechnical Commission, 08/30/2018

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IEC 60050-845 Ed. 1.0 t:1987

International Electrotechnical Vocabulary (IEV) – Part 845: Lighting
standard by International Electrotechnical Commission, 12/15/1987

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IEC 61784-2 Ed. 4.0 b:2019

Industrial communication networks – Profiles – Part 2: Additional fieldbus profiles for real-time networks based on ISO/IEC 8802-3
standard by International Electrotechnical Commission, 04/10/2019

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IEC 60151-1 Ed. 1.0 b:1963

Measurements of the electrical properties of electronic tubes and valves – Part 1: Measurement of electrode current
standard by International Electrotechnical Commission, 01/01/1963

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IEC 60092-501 Ed. 5.0 en:2013

Electrical installations in ships – Part 501: Special features – Electric propulsion plant
standard by International Electrotechnical Commission, 10/22/2013

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IEC 60050-191 Ed. 1.0 t:1990

International Electrotechnical Vocabulary. Chapter 191: Dependability and quality of service
standard by International Electrotechnical Commission, 12/31/1990

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IEC 62878-2-5 Ed. 1.0 b:2019

Device embedding assembly technology – Part 2-5: Guidelines – Implementation of a 3D data format for device embedded substrate
standard by International Electrotechnical Commission, 09/16/2019

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IEC 62149-11 Ed. 1.0 b:2020

Fibre optic active components and devices – Performance standards – Part 11: Multiple channel transmitter/receiver chip scale package with multimode fibre interface
standard by International Electrotechnical Commission, 04/28/2020

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IEC 60191-6-16 Ed. 1.0 en:2007

Mechanical standardization of semiconductor devices – Part 6-16: Glossary of semiconductor tests and burn-in sockets for BGA, LGA, FBGA and FLGA
standard by International Electrotechnical Commission, 04/26/2007

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