IEC 60747-5-9 Ed. 1.0 en:2019

Semiconductor devices – Part 5-9: Optoelectronic devices – Light emitting diodes – Test method of the internal quantum efficiency based on the temperature-dependent electroluminescence
standard by International Electrotechnical Commission, 12/11/2019

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IEC 60068-2-57 Ed. 2.0 b:1999

Environmental testing – Part 2-57: Tests – Test Ff: Vibration – Time-history method
standard by International Electrotechnical Commission, 11/18/1999

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IEC 60061-2 Ed. 3.4 b:2005

Lamp caps and holders together with gauges for the control of interchangeability and safety – Part 2: Lampholders CONSOLIDATED EDITION
standard by International Electrotechnical Commission, 01/27/2005

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IEC 60079-0 Cor. 1 Ed. 7.0 b:2017

Corrigendum 1 – Explosive atmospheres – Part 0: Equipment – General requirements
Corrigenda by International Electrotechnical Commission, 01/20/2020

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IEC 62899-503-1 Ed. 1.0 en:2020

Printed electronics – Part 503-1: Quality assessment – Test method of displacement current measurement for printed thin-film transistor
standard by International Electrotechnical Commission, 05/27/2020

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IEC 60071-2 Ed. 3.0 b:1996

Insulation co-ordination – Part 2: Application guide
standard by International Electrotechnical Commission, 12/19/1996

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IEC 63182-1 Ed. 1.0 en:2020

Magnetic powder cores – Guidelines on dimensions and the limits of surface irregularities – Part 1: General specification
standard by International Electrotechnical Commission, 05/27/2020

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IEC 60050-114 Ed. 1.0 b:2014

International Electrotechnical Vocabulary (IEV) – Part 114: Electrochemistry
standard by International Electrotechnical Commission, 03/25/2014

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IEC 61340-5-1 Cor.1 Ed. 2.0 b:2017

Corrigendum 1 – Electrostatics – Part 5-1: Protection of electronic devices from electrostatic phenomena – General requirements
Corrigenda by International Electrotechnical Commission, 05/01/2017

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IEC 60050-726 Amd.5 Ed. 1.0 b:2020

Amendment 5 – International Electrotechnical Vocabulary (IEV) – Part 726: Transmission lines and waveguides
Amendment by International Electrotechnical Commission, 04/23/2020

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