IEC 60068-2-69 Amd.1 Ed. 3.0 b:2017

Amendment 1 – Environmental testing – Part 2-69: Tests – Test Te/Tc: Solderability testing of electronic components and printed boards by the wetting balance (force measurement) method
Amendment by International Electrotechnical Commission, 06/19/2019

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IEC 60027-3 Ed. 3.0 b:2002

Letter symbols to be used in electrical technology – Part 3: Logarithmic and related quantities, and their units
standard by International Electrotechnical Commission, 07/19/2002

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IEC 60050-705 Ed. 1.0 t:1995

International Electrotechnical Vocabulary (IEV) – Part 705: Radio wave propagation
standard by International Electrotechnical Commission, 09/29/1995

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IEC 62003 Ed. 2.0 b:2020

Nuclear power plants – Instrumentation and control important to safety – Requirements for electromagnetic compatibility testing
standard by International Electrotechnical Commission, 03/11/2020

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IEC 60598-2-1 Ed. 2.0 b:2020

Luminaires. Part 2: Particular requirements. Section One: Fixed general purpose luminaires
standard by International Electrotechnical Commission, 01/28/2020

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IEC 62541-8 Ed. 3.0 b:2020

OPC Unified Architecture – Part 8: Data Access
standard by International Electrotechnical Commission, 06/22/2020

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IEC 60050-131 Amd.3 Ed. 2.0 b:2019

Amendment 3 – International Electrotechnical Vocabulary (IEV) – Part 131: Circuit theory
Amendment by International Electrotechnical Commission, 10/17/2019

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IEC 60050-113 Amd.3 Ed. 1.0 b:2020

Amendment 3 – International Electrotechnical Vocabulary (IEV) – Part 113: Physics for electrotechnology
Amendment by International Electrotechnical Commission, 04/23/2020

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IEC 60068-3-6 Ed. 2.0 b:2018

Environmental testing – Part 3-6: Supporting documentation and guidance – Confirmation of the performance of temperature/ humidity chambers
standard by International Electrotechnical Commission, 01/23/2018

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IEC 60068-2-5 Ed. 2.0 b CORR1:2010

Corrigendum 1 – Environmental testing – Part 2-5: Tests – Test Sa: Simulated solar radiation at ground level and guidance for solar radiation testing
Corrigenda by International Electrotechnical Commission, 12/16/2010

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