IEC 62841-2-11 Ed. 1.0 b:2015

Electric motor-operated hand-held tools, transportable tools and lawn and garden machinery – Safety – Part 2-11: Particular requirements for hand-held reciprocating saws
standard by International Electrotechnical Commission, 11/18/2015

IEC 80601-2-71 Ed. 1.0 en:2015

Medical electrical equipment – Part 2-71: Particular requirements for the basic safety and essential performance of functional near-infrared spectroscopy (NIRS) equipment
standard by International Electrotechnical Commission, 06/09/2015

IEC 62899-201 Ed. 1.1 en:2018

Printed electronics – Part 201: Materials – Substrates CONSOLIDATED EDITION
standard by International Electrotechnical Commission, 11/15/2018

IEC 62798 Ed. 1.0 b:2014

Industrial electroheating equipment – Test methods for infrared emitters
standard by International Electrotechnical Commission, 08/25/2014

IEC 62664-1-1 Ed. 1.0 b:2013

Fibre optic interconnecting devices and passive components – Fibre optic connector product specifications – Part 1-1: LC-PC duplex multimode connectors terminated on IEC 60793-2-10 category A1a fibre
standard by International Electrotechnical Commission, 02/20/2013

IEC 62943 Ed. 1.0 b:2017

Visible light beacon system for multimedia applications
standard by International Electrotechnical Commission, 03/07/2017

IEC 80601-2-59 Ed. 2.0 b:2017

Medical electrical equipment – Part 2-59: Particular requirements for the basic safety and essential performance of screening thermographs for human febrile temperature screening
standard by International Electrotechnical Commission, 09/19/2017

IEC 62677-3-103 Ed. 1.0 b:2019

Heat-shrinkable low and medium voltage moulded shapes – Part 3: Specification for individual materials – Sheet 103: Heat-shrinkable, polyolefin, conductive moulded shapes for medium voltage applications
standard by International Electrotechnical Commission, 05/14/2019

IEC 63006 Ed. 1.0 b:2019

Wireless power transfer (WPT) – Glossary of terms
standard by International Electrotechnical Commission, 10/14/2019

IEC 63068-2 Ed. 1.0 en:2019

Semiconductor devices – Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices – Part 2: Test method for defects using optical inspection
standard by International Electrotechnical Commission, 01/30/2019