IEC 80000-14 Ed. 1.0 b:2008

Quantities and units – Part 14: Telebiometrics related to human physiology
standard by International Electrotechnical Commission, 03/18/2008

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IEC 80601-2-30 Ed. 1.1 b:2013

Medical electrical equipment – Part 2-30: Particular requirements for the basic safety and essential performance of automated non-invasive sphygmomanometers CONSOLIDATED EDITION
standard by International Electrotechnical Commission, 07/31/2013

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IEC 62766-5-2 Ed. 1.0 en:2017

Consumer terminal function for access to IPTV and open multimedia services – Part 5-2: Web standards TV profile
standard by International Electrotechnical Commission, 07/26/2017

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IEC 63145-20-10 Ed. 1.0 en:2019

Eyewear display – Part 20-10: Fundamental measurement methods – Optical properties
standard by International Electrotechnical Commission, 08/16/2019

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IEC 62755 Ed. 1.0 en:2012

Radiation protection instrumentation – Data format for radiation instruments used in the detection of illicit trafficking of radioactive materials
standard by International Electrotechnical Commission, 10/25/2012

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IEC 63009 Ed. 1.0 b:2019

Ultrasonics – Physiotherapy systems – Field specifications and methods of measurement in the frequency range 20 kHz to 500 kHz
standard by International Electrotechnical Commission, 07/11/2019

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IEC 80416-3 Ed. 1.0 b:2002

Basic principles for graphical symbols for use on equipment – Part 3: Guidelines for the application of graphical symbols
standard by International Electrotechnical Commission, 07/19/2002

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IEC 62784 Ed. 1.1 b:2019

Vacuum cleaners and dust extractors providing equipment protection level Dc for the collection of combustible dusts – Particular requirements CONSOLIDATED EDITION
standard by International Electrotechnical Commission, 01/16/2019

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IEC 62830-1 Ed. 1.0 b:2017

Semiconductor devices – Semiconductor devices for energy harvesting and generation – Part 1: Vibration based piezoelectric energy harvesting
standard by International Electrotechnical Commission, 03/03/2017

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IEC 63068-1 Ed. 1.0 en:2019

Semiconductor devices – Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices – Part 1: Classification of defects
standard by International Electrotechnical Commission, 01/30/2019

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