IEC 62448 Ed. 2.0 b:2009

Multimedia systems and equipment – Multimedia e-publishing and e-books – Generic format for e-publishing
standard by International Electrotechnical Commission, 02/25/2009

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IEC 62286 Ed. 1.0 en:2003

Service diagnostic interface for consumer electronics products and networks – Implementation for IEEE 1394
standard by International Electrotechnical Commission, 05/16/2003

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IEC 62149-7 Ed. 1.0 b:2012

Fibre optic active components and devices – Performance standards – Part 7: 1 310-nm discrete vertical cavity surface emitting laser devices
standard by International Electrotechnical Commission, 03/29/2012

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IEC 62132-1 Ed. 1.0 b:2006

Integrated circuits – Measurement of electromagnetic immunity, 150 kHz to 1 GHz – Part 1: General conditions and definitions
standard by International Electrotechnical Commission, 01/19/2006

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IEC 62127-2 Ed. 1.0 en:2007

Ultrasonics – Hydrophones – Part 2: Calibration for ultrasonic fields up to 40 MHz
standard by International Electrotechnical Commission, 08/23/2007

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IEC 62148-15 Ed. 1.0 b:2009

Fibre optic active components and devices – Package and interface standards – Part 15: Discrete vertical cavity surface emitting laser packages
standard by International Electrotechnical Commission, 12/17/2009

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IEC 62148-7 Ed. 1.0 b:2003

Fibre optic active components and devices – Package and interface standards – Part 7: SFF LC 10-pin transceivers
standard by International Electrotechnical Commission, 02/10/2003

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IEC 62055-51 Ed. 1.0 en:2007

Electricity metering – Payment systems – Part 51: Standard transfer specification (STS) – Physical layer protocol for one-way numeric and magnetic card token carriers
standard by International Electrotechnical Commission, 05/23/2007

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IEC 62496-2 Ed. 1.0 en:2017

Optical circuit boards – Basic test and measurement procedures – Part 2: General guidance for definition of measurement conditions for optical characteristics of optical circuit boards
standard by International Electrotechnical Commission, 05/24/2017

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IEC 62416 Ed. 1.0 b:2010

Semiconductor devices – Hot carrier test on MOS transistors
standard by International Electrotechnical Commission, 04/26/2010

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