Semiconductor devices – Micro-electromechanical devices – Part 12: Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures
standard by International Electrotechnical Commission, 09/13/2011
Industrial-process measurement and control – Data structures and elements in process equipment catalogues – Part 23: Lists of Properties (LOPs) of actuators for electronic data exchange
standard by International Electrotechnical Commission, 09/15/2015
Protection against lightning – Part 2: Risk management
standard by International Electrotechnical Commission, 12/09/2010
Railway applications – Fixed installations – DC switchgear – Part 3: Indoor disconnectors and switch disconnectors
standard by International Electrotechnical Commission, 02/22/2001
3D Display devices – Part 13-1: Visual inspection methods for stereoscopic displays using glasses – Ghost image
standard by International Electrotechnical Commission, 10/11/2017
Insulators – Glossary of terms and definitions
standard by International Electrotechnical Commission, 06/10/2009
Ultrasonics – Hydrophones – Part 2: Calibration for ultrasonicfields up to 40 MHz CONSOLIDATED EDITION
standard by International Electrotechnical Commission, 02/08/2013
Nuclear power plants – Instrumentation and control important to safety – Methods for assessing the performance of safety system instrument channels
standard by International Electrotechnical Commission, 06/21/2007
Electricity metering equipment (a.c.) – Particular requirements – Part 61: Power consumption and voltage requirements
standard by International Electrotechnical Commission, 02/12/1998
Lightning protection system components (LPSC) – Part 5: Requirements for earth electrode inspection housings and earth electrode seals
standard by International Electrotechnical Commission, 07/28/2017
