IEC 62317-13 Ed. 2.0 b:2015

Ferrite cores – Dimensions – Part 13: PQ-cores for use in power supply applications
standard by International Electrotechnical Commission, 08/20/2015

IEC 62298-1 Ed. 1.0 b:2005

Teleweb application – Part 1: General description
standard by International Electrotechnical Commission, 05/18/2005

IEC 61967-6 Amd.1 Ed. 1.0 b:2008

Amendment 1 – Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 6: Measurement of conducted emissions – Magnetic probe method
Amendment by International Electrotechnical Commission, 03/12/2008

IEC 62435-1 Ed. 1.0 b:2017

Electronic components – Long-term storage of electronic semiconductor devices – Part 1: General
standard by International Electrotechnical Commission, 01/20/2017

IEC 62568 Ed. 1.0 b:2015

Overhead lines – Method for fatigue testing of conductors
standard by International Electrotechnical Commission, 07/09/2015

IEC 62037-2 Ed. 1.0 en:2012

Passive RF and microwave devices, intermodulation level measurement – Part 2: Measurement of passive intermodulation in coaxial cable assemblies
standard by International Electrotechnical Commission, 11/07/2012

IEC 61996 Ed. 1.0 en:2000

Maritime navigation and radiocommunication equipment and systems – Shipborne voyage data recorder (VDR) – Performance requirements – Methods of testing and required test results
standard by International Electrotechnical Commission, 07/31/2000

IEC 61770 Ed. 2.0 b:2008

Electric appliances connected to the water mains – Avoidance of backsiphonage and failure of hose-sets
standard by International Electrotechnical Commission, 07/23/2008

IEC 62423 Ed. 2.0 b:2009

Type F and type B residual current operated circuit-breakers with and without integral overcurrent protection for household and similar uses
standard by International Electrotechnical Commission, 11/20/2009

IEC 62433-2 Ed. 1.0 en:2008

EMC IC modelling – Part 2: Models of integrated circuits for EMI behavioural simulation – Conducted emissions modelling (ICEM-CE)
standard by International Electrotechnical Commission, 10/08/2008