IEC 61701 Ed. 2.0 b:2011

Salt mist corrosion testing of photovoltaic (PV) modules
standard by International Electrotechnical Commission, 12/15/2011

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IEC 61788-10 Ed. 2.0 b:2006

Superconductivity – Part 10: Critical temperature measurement – Critical temperature of composite superconductors by a resistance method
standard by International Electrotechnical Commission, 08/11/2006

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IEC 61710 Ed. 2.0 b:2013

Power law model – Goodness-of-fit tests and estimation methods
standard by International Electrotechnical Commission, 05/22/2013

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IEC 61784-5-3 Ed. 3.0 b:2013

Industrial communication networks – Profiles – Part 5-3: Installation of fieldbuses – Installation profiles for CPF 3
standard by International Electrotechnical Commission, 09/13/2013

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IEC 61800-7-201 Ed. 1.0 en:2007

Adjustable speed electrical power drive systems – Part 7-201: Generic interface and use of profiles for power drive systems – Profile type 1 specification
standard by International Electrotechnical Commission, 11/27/2007

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IEC 61784-5-21 Ed. 1.0 en:2018

Industrial communication networks – Profiles – Part 5-21: Installation of fieldbuses – Installation profiles for CPF 21
standard by International Electrotechnical Commission, 08/30/2018

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IEC 61784-5-10 Amd.1 Ed. 2.0 b:2015

Amendment 1 – Industrial communication networks – Profiles – Part 5-10: Installation of fieldbuses – Installation profiles for CPF 10
Amendment by International Electrotechnical Commission, 06/18/2015

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IEC 61726 Ed. 2.0 b:1999

Cable assemblies, cables, connectors and passive microwave components – Screening attenuation measurement by the reverberation chamber method
standard by International Electrotechnical Commission, 11/30/1999

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IEC 61730-2 Ed. 1.0 b:2004

Photovoltaic (PV) module safety qualification – Part 2: Requirements for testing
standard by International Electrotechnical Commission, 10/14/2004

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IEC 61788-6 Ed. 2.0 en:2008

Superconductivity – Part 6: Mechanical properties measurement – Room temperature tensile test of Cu/Nb-Ti composite superconductors
standard by International Electrotechnical Commission, 01/22/2008

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