IEC 61340-4-3 Ed. 2.0 b:2017

Electrostatics – Part 4-3: Standard test methods for specific applications – Footwear
standard by International Electrotechnical Commission, 12/13/2017

IEC 61599 Ed. 1.0 b:1999

Videodisk players – Methods of measurement
standard by International Electrotechnical Commission, 09/16/1999

IEC 61534-1 Ed. 2.0 b:2011

Powertrack systems – Part 1: General requirements
standard by International Electrotechnical Commission, 05/18/2011

IEC 61400-21-1 Ed. 1.0 b:2019

Wind energy generation systems – Part 21-1: Measurement and assessment of electrical characteristics – Wind turbines
standard by International Electrotechnical Commission, 05/20/2019

IEC 61300-3-44 Ed. 1.0 b:2012

Fibre optic interconnecting devices and passive components – Basic test and measurement procedures – Part 3-44: Examinations and measurements – Fibre optic trancsceiver receptacle endface visual and automated inspection
standard by International Electrotechnical Commission, 08/30/2012

IEC 61587-2 Ed. 2.0 b:2011

Mechanical structures for electronic equipment – Tests for IEC 60917 and 60297 – Part 2: Seismic tests for cabinets and racks
standard by International Electrotechnical Commission, 08/25/2011

IEC 61643-331 Ed. 1.0 b:2003

Components for low-voltage surge protective devices – Part 331: Specification for metal oxide varistors (MOV)
standard by International Electrotechnical Commission, 05/27/2003

IEC 61338-1 Ed. 1.0 b:2004

Waveguide type dielectric resonators – Part 1: Generic specification
standard by International Electrotechnical Commission, 11/02/2004

IEC 61300-3-16 Ed. 2.0 b:2004

Fibre optic interconnecting devices and passive components – Basic test and measurement procedures – Part 3-16: Examinations and measurements – Endface radius of spherically polished ferrules
standard by International Electrotechnical Commission, 01/26/2004

IEC 61619 Ed. 1.0 b:1997

Insulating liquids – Contamination by polychlorinated biphenyls (PCBs) – Method of determination by capillary column gas chromatography
standard by International Electrotechnical Commission, 04/10/1997