Detail specification for low power silicon p-n-p switching transistors. 65 V, planar epitaxial, ambient rated, hermetic encapsulation (long lead version). Full plus additional assessment level
standard by BSI Group, 07/15/1978
Smart card systems. Interoperable citizen sevices. User related information (based on DISTINCT). Guidelines for creating, operating and maintaining an interoperable network
standard by BSI Group, 10/15/2000
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fusible link programmable bipolar read only memories, silicon monolithic integrated circuits
standard by BSI Group, 05/15/1987
Extensions for financial services (XFS) interface specification. Release 3.0. Card embossing unit class interface
standard by BSI Group, 11/15/2000
Physical testing of rubber. Method for determination of green strength of raw rubber of unvulcanized compounds
standard by BSI Group, 09/15/1993
Bihexagonal drives. Wrenching configuration. Metric series
standard by BSI Group, 05/15/1998
The structural use of aluminium
standard by BSI Group, 06/18/1969
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Fixed capacitors of ceramic dielectric, class 2. (Assessment level E)
standard by BSI Group, 02/15/1993
European call centre standards for training and qualification. Customer contact representatives
standard by BSI Group, 12/15/2000
Harmonized system of quality assessment for electronic components. Sectional specification: low power single-turn rotary potentiometers
standard by BSI Group, 10/31/1979
