Harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Blank detail specification: fixed low power non-wirewound resistors. Assessment level E
standard by BSI Group, 12/15/1983
Harmonized system of quality assessment for electronic components. Capability detail specification: single and double-sided printed boards with plated through holes
standard by BSI Group, 06/15/1998
Disaster and emergency management systems
Handbook / Manual / Guide by BSI Group, 10/09/2008
Physical testing of rubber. Determination of compression stress-strain properties
standard by BSI Group, 07/31/1990
Harmonized system of quality assessment for electronic components. Inductor and transformer cores for telecommunications. Sectional specification: Magnetic oxide cores for transformers and chokes for power applications
standard by BSI Group, 05/31/1988
Detail specification for multi-contact circular electrical connectors for d.c. and low frequency applications. Bayonet coupling with front release, rear removable crimp contacts. Full assessment level
standard by BSI Group, 04/15/1982
General requirements for a system for electronic components of assessed quality. Specification of lot formation, release procedures and certified test records
standard by BSI Group, 10/31/1989
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fixed precision resistors (Assessment level F)
standard by BSI Group, 06/15/1978
Detail specification for silicon voltage regulator diodes. 1.5 W, 6.8 to 200 V (5%), hermetically sealed. General application category C
standard by BSI Group, 03/15/1972
Book by BSI Group, 06/01/2006
