ASTM F847-94(1999)
Standard Test Methods for Measuring Crystallographic Orientation of Flats on Single Crystal Silicon Wafers by X-Ray Techniques
standard by ASTM International, 01/01/1999
- Comments Off on ASTM F847-94(1999)
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Standard Test Methods for Measuring Crystallographic Orientation of Flats on Single Crystal Silicon Wafers by X-Ray Techniques
standard by ASTM International, 01/01/1999
Standard Practice for Determining Toner Usage, Efficiency, and Dusting Nonheat Fixing Copiers Using Single-Component Toner Systems
standard by ASTM International, 06/01/2006
Standard Test Method for Impact Resistance of Pipeline Coatings (Limestone Drop Test) (Withdrawn 2003)
standard by ASTM International, 01/01/1996
Standard Specification for Smoothwall Polyethylene (PE) Pipe for Use in Drainage and Waste Disposal Absorption Fields
standard by ASTM International, 02/01/2018
Standard Guide for Digital Data Acquisition in Wear and Friction Measurements
standard by ASTM International, 11/01/2004
Standard Specification for Crosslinked Polyethylene (PEX) Hot- and Cold-Water Distribution Systems
standard by ASTM International, 04/01/2018
Standard Test Method for Evaluating the Ignition Sensitivity and Fault Tolerance of Oxygen Regulators Used for Medical and Emergency Applications
standard by ASTM International, 04/10/2003
Standard Guide for Studying Fire Incidents in Oxygen Systems
standard by ASTM International, 10/10/1996
Standard Practice for Qualification of Polyethylene Saddle Fusion Joints
standard by ASTM International, 01/01/1996
Standard Practice for Operating Xenon Arc Light Apparatus for Exposure of Non-Metallic Materials
standard by ASTM International, 10/01/2005