ASTM F996-98(2003)

Click here to purchase
Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current-Voltage Characteristics

Product Details

Published:
01/01/2003
Number of Pages:
7
File Size:
1 file , 89 KB

Related Posts